Inventor · disambiguated record
David W. Duquette
Also filed as: DUQUETTE DAVID W
10 granted patents·12 pending applications·187 citations·filing 1999–2019
90Inventor score
Top patents by PatentIndex Score
22 records- 0190US7239399B2Pick and place machine with component placement inspectionCYBEROPTICS CORP·Filed 2002·Granted Jul 3, 2007·45 cites·11 claims
- 0289US7813559B2Image analysis for pick and place machines with in situ component placement inspectionCYBEROPTICS CORP·Filed 2005·Granted Oct 12, 2010·24 cites·20 claims
- 0385US6762847B2Laser align sensor with sequencing light sourcesCYBEROPTICS CORP·Filed 2001·Granted Jul 13, 2004·43 cites·53 claims
- 0483US7746481B2Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beamCYBEROPTICS CORP·Filed 2008·Granted Jun 29, 2010·18 cites·12 claims
- 0582US7545514B2Pick and place machine with improved component pick image processingCYBEROPTICS CORP·Filed 2006·Granted Jun 9, 2009·11 cites·31 claims
- 0681US6744499B2Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2003·Granted Jun 1, 2004·23 cites·13 claims
- 0780US11468590B2Wireless substrate-like teaching sensor for semiconductor processingCYBEROPTICS CORP·Filed 2019·Granted Oct 11, 2022·5 cites·36 claims
- 0870US6535291B1Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2000·Granted Mar 18, 2003·13 cites·13 claims
- 0956US2009135251A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 1056US2009133249A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 1154US2009046921A1Pick and place machine with improved component pick up inspectionCYBEROPTICS CORP·Filed 2008·Application pending·0 cites
- 1253US2007116352A1Pick and place machine with component placement inspectionCYBEROPTICS CORP·Filed 2007·Application pending·0 cites
- 1350US2007003126A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCASE STEVEN K·Filed 2006·Application pending·0 cites
- 1447US2007120977A1Pick and place machine with component placement inspectionCYBEROPTICS CORP·Filed 2007·Application pending·0 cites
- 1547US2007116351A1Pick and place machine with component placement inspectionCYBEROPTICS CORP·Filed 2007·Application pending·0 cites
- 1647US2006075631A1Pick and place machine with improved component pick up inspectionCASE STEVEN K·Filed 2005·Application pending·0 cites
- 1745US6639239B2Angle rejection filterCYBEROPTICS CORP·Filed 2001·Granted Oct 28, 2003·1 cites·28 claims
- 1845US2007130755A1Electronics assembly machine with embedded solder paste inspectionDUQUETTE DAVID W·Filed 2006·Application pending·0 cites
- 1940US2008199068A1Inspection SystemDUQUETTE DAVID W·Filed 2008·Application pending·0 cites
- 2036US2017264885A1Field calibration of three-dimensional non-contact scanning systemCYBEROPTICS CORP·Filed 2017·Application pending·0 cites
- 2136US2010295935A1On-head component alignment using multiple area array image detectorsCASE STEVEN K·Filed 2010·Application pending·0 cites
- 2233US6291830B1Methods and apparatus for controlling glint in a position alignment sensorCYBEROPTICS CORP·Filed 1999·Granted Sep 18, 2001·4 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →