Inventor · disambiguated record
David M. Fried
Also filed as: FRIED DAVID · FRIED DAVID M · FRIED DAVID MICHAEL
71 granted patents·10 pending applications·3,514 citations·filing 2000–2023
99Inventor score
Top patents by PatentIndex Score
81 records- 0199US6849884B2Strained Fin FETs structure and methodIBM·Filed 2003·Granted Feb 1, 2005·228 cites·18 claims
- 0299US6635909B2Strained fin FETs structure and methodIBM·Filed 2002·Granted Oct 21, 2003·237 cites·18 claims
- 0398US7288445B2Double gated transistor and method of fabricationIBM·Filed 2005·Granted Oct 30, 2007·125 cites·3 claims
- 0498US6815277B2Method for fabricating multiple-plane FinFET CMOSIBM·Filed 2003·Granted Nov 9, 2004·163 cites·6 claims
- 0598US6662350B2FinFET layout generationIBM·Filed 2002·Granted Dec 9, 2003·291 cites·19 claims
- 0698US6657252B2FinFET CMOS with NVRAM capabilityIBM·Filed 2002·Granted Dec 2, 2003·193 cites·12 claims
- 0798US6657259B2Multiple-plane FinFET CMOSIBM·Filed 2001·Granted Dec 2, 2003·187 cites·13 claims
- 0898US6642090B1Fin FET devices from bulk semiconductor and method for formingIBM·Filed 2002·Granted Nov 4, 2003·540 cites·18 claims
- 0998US6583469B1Self-aligned dog-bone structure for FinFET applications and methods to fabricate the sameIBM·Filed 2002·Granted Jun 24, 2003·268 cites·8 claims
- 1097US7163851B2Concurrent Fin-FET and thick-body device fabricationIBM·Filed 2002·Granted Jan 16, 2007·111 cites·22 claims
- 1196US9659126B2Modeling pattern dependent effects for a 3-D virtual semiconductor fabrication environmentCOVENTOR INC·Filed 2015·Granted May 23, 2017·12 cites·28 claims
- 1296US7087477B2FinFET SRAM cell using low mobility plane for cell stability and method for formingIBM·Filed 2004·Granted Aug 8, 2006·120 cites·18 claims
- 1396US6967351B2Finfet SRAM cell using low mobility plane for cell stability and method for formingIBM·Filed 2001·Granted Nov 22, 2005·104 cites·13 claims
- 1496US6812075B2Self-aligned dog-bone structure for FinFET applications and methods to fabricate the sameIBM·Filed 2003·Granted Nov 2, 2004·127 cites·10 claims
- 1596US6767793B2Strained fin FETs structure and methodIBM·Filed 2003·Granted Jul 27, 2004·90 cites·18 claims
- 1695US9965577B2System and method for performing directed self-assembly in a 3-D virtual fabrication environmentCOVENTOR INC·Filed 2016·Granted May 8, 2018·10 cites·24 claims
- 1795US7645650B2Double gated transistor and method of fabricationIBM·Filed 2007·Granted Jan 12, 2010·29 cites·18 claims
- 1893US11144701B2System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2018·Granted Oct 12, 2021·15 cites·27 claims
- 1993US7517806B2Integrated circuit having pairs of parallel complementary FinFETsIBM·Filed 2005·Granted Apr 14, 2009·21 cites·22 claims
- 2092US7060553B2Formation of capacitor having a Fin structureIBM·Filed 2005·Granted Jun 13, 2006·19 cites·13 claims
- 2192US6750487B2Dual double gate transistorIBM·Filed 2002·Granted Jun 15, 2004·56 cites·18 claims
- 2292US6664582B2Fin memory cell and method of fabricationIBM·Filed 2002·Granted Dec 16, 2003·68 cites·20 claims
- 2390US11861289B2System and method for performing process model calibration in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2021·Granted Jan 2, 2024·2 cites·17 claims
- 2490US10242142B2Predictive 3-D virtual fabrication system and methodCOVENTOR INC·Filed 2013·Granted Mar 26, 2019·12 cites·19 claims
- 2590US8959464B2Multi-etch process using material-specific behavioral parameters in 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Feb 17, 2015·14 cites·25 claims
- 2690US8236632B2FET structures with trench implantation to improve back channel leakage and body resistanceFRIED DAVID M·Filed 2010·Granted Aug 7, 2012·10 cites·24 claims
- 2790US6800905B2Implanted asymmetric doped polysilicon gate FinFETIBM·Filed 2001·Granted Oct 5, 2004·48 cites·14 claims
- 2889US8832620B1Rule checks in 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Sep 9, 2014·23 cites·20 claims
- 2989US6888187B2DRAM cell with enhanced SER immunityIBM·Filed 2002·Granted May 3, 2005·42 cites·15 claims
- 3088US7872310B2Semiconductor structure and system for fabricating an integrated circuit chipIBM·Filed 2009·Granted Jan 18, 2011·11 cites·6 claims
- 3187US6995412B2Integrated circuit with capacitors having a fin structureIBM·Filed 2002·Granted Feb 7, 2006·36 cites·13 claims
- 3286US9317632B2System and method for modeling epitaxial growth in a 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Apr 19, 2016·11 cites·17 claims
- 3386US6943405B2Integrated circuit having pairs of parallel complementary FinFETsIBM·Filed 2003·Granted Sep 13, 2005·28 cites·18 claims
- 3486US6720231B2Fin-type resistorsIBM·Filed 2002·Granted Apr 13, 2004·32 cites·10 claims
- 3585US8809953B2FET structures with trench implantation to improve back channel leakage and body resistanceFRIED DAVID M·Filed 2012·Granted Aug 19, 2014·6 cites·20 claims
- 3685US7064019B2Implanted asymmetric doped polysilicon gate FinFETIBM·Filed 2004·Granted Jun 20, 2006·30 cites·11 claims
- 3784US7101741B2Dual double gate transistor and method for formingIBM·Filed 2004·Granted Sep 5, 2006·28 cites·18 claims
- 3881US10977405B2Fill process optimization using feature scale modelingLAM RES CORP·Filed 2019·Granted Apr 13, 2021·3 cites·20 claims
- 3980US7875550B2Method and structure for self-aligned device contactsIBM·Filed 2008·Granted Jan 25, 2011·7 cites·18 claims
- 4080US7385251B2Area-efficient gated diode structure and method of forming sameIBM·Filed 2006·Granted Jun 10, 2008·7 cites·1 claims
- 4180US7052958B1FinFET CMOS with NVRAM capabilityIBM·Filed 2003·Granted May 30, 2006·22 cites·9 claims
- 4280US6546303B1Computation of supply chain planning process efficiencyIBM·Filed 2002·Granted Apr 8, 2003·29 cites·30 claims
- 4377US11630937B2System and method for predictive 3-D virtual fabricationCOVENTOR INC·Filed 2021·Granted Apr 18, 2023·0 cites·20 claims
- 4477US10762267B2System and method for electrical behavior modeling in a 3D virtual fabrication environmentCOVENTOR INC·Filed 2017·Granted Sep 1, 2020·4 cites·20 claims
- 4577US7064413B2Fin-type resistorsIBM·Filed 2004·Granted Jun 20, 2006·18 cites·11 claims
- 4676US12475297B2System and method for performing process model calibration in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 4776US7884396B2Method and structure for self-aligned device contactsIBM·Filed 2008·Granted Feb 8, 2011·5 cites·19 claims
- 4875US11624981B2Resist and etch modelingLAM RES CORP·Filed 2019·Granted Apr 11, 2023·1 cites·19 claims
- 4975US7956417B2Method of reducing stacking faults through annealingIBM·Filed 2010·Granted Jun 7, 2011·3 cites·6 claims
- 5074US6934671B2Method and system for including parametric in-line test data in simulations for improved model to hardware correlationIBM·Filed 2001·Granted Aug 23, 2005·28 cites·36 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →