Inventor · disambiguated record
David S. Hendrickson
Also filed as: HENDRICKSON DAVID S
16 granted patents·6 pending applications·156 citations·filing 2002–2024
93Inventor score
Top patents by PatentIndex Score
22 records- 0197US8228085B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2010·Granted Jul 24, 2012·26 cites·22 claims
- 0296US11448695B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2020·Granted Sep 20, 2022·3 cites·35 claims
- 0396US9250291B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2012·Granted Feb 2, 2016·19 cites·22 claims
- 0495US7800382B2System for testing an integrated circuit of a device and its method of useAEHR Test Ststems·Filed 2007·Granted Sep 21, 2010·40 cites·26 claims
- 0593US7969175B2Separate test electronics and blower modules in an apparatus for testing an integrated circuitAEHR TEST SYSTEMS·Filed 2009·Granted Jun 28, 2011·27 cites·81 claims
- 0692US2025085337A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0792US2025085338A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0891US2024393387A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0991US2024402243A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1091US2024393388A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1191US2024410938A1System for testing an integrated circuit of a device and itsmethod of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1283US12326472B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2022·Granted Jun 10, 2025·0 cites·12 claims
- 1378US6815966B1System for burn-in testing of electronic devicesAEHR TEST SYSTEMS·Filed 2002·Granted Nov 9, 2004·24 cites·26 claims
- 1470US8986048B2Integrated feedthrough moduleHENDRICKSON DAVID S·Filed 2011·Granted Mar 24, 2015·3 cites·9 claims
- 1566US10677843B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2015·Granted Jun 9, 2020·0 cites·56 claims
- 1662US10488437B2Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power modeAEHR TEST SYSTEMS·Filed 2017·Granted Nov 26, 2019·0 cites·14 claims
- 1761US7063544B2System for burn-in testing of electronic devicesAEHR TEST SYSTEMS·Filed 2004·Granted Jun 20, 2006·7 cites·18 claims
- 1856US9874583B2Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power modeAEHR TEST SYSTEMS·Filed 2015·Granted Jan 23, 2018·0 cites·12 claims
- 1952USD850309SLayout of contactsAEHR TEST SYSTEMS·Filed 2017·Granted Jun 4, 2019·4 cites·1 claims
- 2039USD629760SInterface on an electronics connectorAEHR TEST SYSTEMS·Filed 2008·Granted Dec 28, 2010·3 cites·1 claims
- 2133USD875579SLayout of contactsAEHR TEST SYSTEMS·Filed 2019·Granted Feb 18, 2020·0 cites·1 claims
- 2231USD630166SConnectorAEHR TEST SYSTEMS·Filed 2008·Granted Jan 4, 2011·0 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when David S. Hendrickson files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →