Inventor · disambiguated record
Dae-Cheol Kang
Also filed as: KANG DAE-CHEOL
1 granted patent·3 pending applications·6 citations·filing 2008–2009
29Inventor score
Technology areasG01R
Files withNICTECH CO LTD4
Top patents by PatentIndex Score
4 records- 0160US7619430B2Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probesNICTECH CO LTD·Filed 2008·Granted Nov 17, 2009·6 cites·13 claims
- 0233US2009224790A1Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probesNICTECH CO LTD·Filed 2009·Application pending·0 cites
- 0327US2008309363A1Probe assembly with wire probesNICTECH CO LTD·Filed 2008·Application pending·0 cites
- 0426US2008174326A1Probe, probe assembly and probe card for electrical testingNICTECH CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →