Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes

Abstract

Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facing surface. The first and second facing surfaces are configured to face a test object, and substantially nonparallel to each other. The probe assembly has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe.

1 . A probe assembly for use in electrical testing of an object, the probe assembly comprising:
 a probe supporter body elongated in a first direction and comprising a first side surface, a second side surface, a first facing surface and a second facing surface, wherein the first and second facing surfaces are configured to face a testing object, wherein the first and second facing surfaces are substantially nonparallel to each other;   a plurality of first slots formed on the first side surface and the first facing surface, wherein each first slot is configured to receive a portion of a probe; and   a plurality of second slots formed on the second side surface and the second facing surface, wherein each second slot is configured to receive a portion of a probe.   
   
   
       2 . The probe assembly of  claim 1 , wherein the probe supporter body has a cross-section having a generally gable shape. 
   
   
       3 . The probe assembly of  claim 1 , wherein the first facing surface and the first side surface form a first angle therebetween, wherein the second facing surface and the second side surface form a second angle therebetween, and wherein the first and second angle are about the same. 
   
   
       4 . The probe assembly of  claim 1 , wherein each first slot comprises a portion extending in a second direction that is substantially perpendicular to the first direction, wherein each second slot comprises a portion extending in the second direction. 
   
   
       5 . The probe assembly of  claim 1 , wherein each first slot comprises a portion extending in a third direction that is substantially perpendicular to the first direction and substantially slanted relative to the second direction, wherein each second slot comprises a portion extending in a fourth second direction that is substantially perpendicular to the first direction and substantially slanted relative to the second direction, wherein the third direction is not parallel to the fourth direction. 
   
   
       6 . The probe assembly of  claim 1 , wherein the probe assembly comprises one of the plurality of first slots which does not overlap any one of the plurality of second slots when viewed in a direction perpendicular to the first side surface. 
   
   
       7 . The probe assembly of  claim 1 , wherein the probe assembly comprises one of the plurality of first slots, which has a width that partially overlaps with a width of one of the plurality of second slots when viewed in a direction perpendicular to the first side surface. 
   
   
       8 . The probe assembly of  claim 1 , wherein the probe assembly comprises one of the plurality of first slots that substantially eclipses one of the plurality of second slots when viewed in a direction perpendicular to the first side surface. 
   
   
       9 . The probe assembly of  claim 1 , wherein the first and second side surfaces are substantially parallel to each other. 
   
   
       10 . The probe assembly of  claim 9 , wherein the first facing surface is substantially slanted with respect to the first side surface. 
   
   
       11 . The probe assembly of  claim 1 , further comprising a first probe engaged with one of the plurality of first slots, and a second probe engaged with one of the plurality of second slots. 
   
   
       12 . The probe assembly of  claim 11 , wherein the first probe comprises:
 a first arm generally extending in a second direction perpendicular to the first direction, wherein a portion of the first arm is inserted in the one of the plurality of first slots,   a second arm electrically and physically connected to the first arm and generally extending in a third direction substantially perpendicular to the first direction and substantially slanted with respect to the second direction, wherein a portion of the second arm is inserted in the one of the plurality of first slots,   a first terminal portion formed at a distal end of the first arm and comprising a first tip configured to contact a first electrode, and   a second terminal portion formed at a distal end of the second arm and comprising a second tip configured to contact a second electrode.   
   
   
       13 . The probe assembly of  claim 1 , further comprising a probe engaged with one of the plurality of first slots, and further comprising a channel generally extending in the first direction and disposed between the first facing surface and the second facing surface, wherein the probe comprises a projection projecting into the channel and further configured to limit the probe's movement in a direction perpendicular to the first side surface. 
   
   
       14 . The probe assembly of  claim 13 , further comprising
 an additional facing surface which is substantially parallel to the first facing surface, wherein the channel is located between the first facing surface and the additional facing surface, and   an additional slot formed on the additional facing surface configured to receive a portion of the probe.   
   
   
       15 . A probe for use in a probe assembly for electrical testing, the probe comprising:
 a first arm extending generally in a fifth direction;   a second arm electrically and physically connected to the first arm and extending generally in a sixth direction substantially slanted with respect to the fifth direction;   a first terminal portion formed at a distal end of the first arm and comprising a first tip configured to form an electrical and physical contact with a first device, wherein the first terminal portion is configured to allow the first tip to elastically move generally in the fifth direction; and   a second terminal portion formed at a distal end of the second arm and comprising a second tip configured to form an electrical and physical contact with a second device, wherein the second terminal portion is configured to allow the second tip to elastically move generally in the fifth direction.   
   
   
       16 . The probe of  claim 15 , wherein the second arm has an upper surface and the probe further comprises a projection extending from the upper surface. 
   
   
       17 . The probe of  claim 15 , wherein the second terminal portion comprises a resilient extension between the second arm and the second tip, wherein the resilient extension generally extend in the sixth direction. 
   
   
       18 . A method of making a probe assembly for use in electrical testing of an object, the method comprising:
 providing a probe supporter which comprises:
 a probe supporter body elongated in a first direction and comprising a first side surface, a second side surface, a first facing surface and a second facing surface which generally extend in the first direction, wherein the first and second facing surfaces are substantially nonparallel to each other, 
 a plurality of first slots formed on the first side surface and the first facing surface, and 
 a plurality of second slots formed into the second side surface and the second facing surface; 
   providing a first probe and a second probe; and   engaging the first probe with one of the plurality of first slots and the second probe with one of the plurality of second slots.   
   
   
       19 . The method of  claim 18 , wherein providing the probe supporter comprises forming the plurality of first slots using a rotating wheel cutter. 
   
   
       20 . The method of  claim 19 , wherein in forming the plurality of first slots, the rotating wheel cutter does not contact the second facing surface.