Inventor · disambiguated record
David Kaz
Also filed as: KAZ DAVID
3 granted patents·9 citations·filing 2016–2018
61Inventor score
Files withKLA TENCOR CORP3
Top patents by PatentIndex Score
3 records- 0187US10018579B1System and method for cathodoluminescence-based semiconductor wafer defect inspectionKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·6 cites·24 claims
- 0280US10056224B2Method and system for edge-of-wafer inspection and reviewKLA TENCOR CORP·Filed 2016·Granted Aug 21, 2018·3 cites·27 claims
- 0354US10770258B2Method and system for edge-of-wafer inspection and reviewKLA TENCOR CORP·Filed 2018·Granted Sep 8, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →