Inventor · disambiguated record
Dales Morrison Kent
Also filed as: KENT DALES · KENT DALES M · KENT DALES MORRISON
13 granted patents·2 pending applications·112 citations·filing 1998–2010
90Inventor score
Top patents by PatentIndex Score
15 records- 0196US7453279B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 18, 2008·30 cites·6 claims
- 0277US7119433B2Packaging for enhanced thermal and structural performance of electronic chip modulesIBM·Filed 2004·Granted Oct 10, 2006·23 cites·13 claims
- 0369US7135877B2Temperature and condensation control system for functional testerIBM·Filed 2004·Granted Nov 14, 2006·11 cites·12 claims
- 0463US5910884AHeatsink retention and air duct assemblyIBM·Filed 1998·Granted Jun 8, 1999·46 cites·19 claims
- 0559US7479796B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jan 20, 2009·1 cites·14 claims
- 0655US9627281B2Semiconductor chip with thermal interface tapePREJEAN SETH·Filed 2010·Granted Apr 18, 2017·1 cites·16 claims
- 0747US7466155B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 16, 2008·0 cites·7 claims
- 0847US7463017B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 9, 2008·0 cites·3 claims
- 0947US7456644B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 25, 2008·0 cites·5 claims
- 1047US7425822B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 16, 2008·0 cites·1 claims
- 1147US7423440B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 9, 2008·0 cites·6 claims
- 1247US7405583B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jul 29, 2008·0 cites·1 claims
- 1345US7352200B2Functional and stress testing of LGA devicesIBM·Filed 2005·Granted Apr 1, 2008·0 cites·14 claims
- 1441US2008186043A1Temperature and Condensation Control System for Functional TesterIBM·Filed 2006·Application pending·0 cites
- 1537US2005030052A1Temperature and condensation control system for functional testerIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →