Inventor · disambiguated record
Dae-Kyeun Kim
Also filed as: KIM DAE K · KIM DAE-KYEUN
13 granted patents·13 pending applications·41 citations·filing 2003–2009
87Inventor score
Files withKIM DAE-KYEUN11DONGBU HITEK CO LTD8DONGBU ELECTRONICS CO LTD5DONGBUANAM SEMICONDUCTOR INC2
Top patents by PatentIndex Score
26 records- 0183US7528033B2Semiconductor device with a dummy gate and a method of manufacturing a semiconductor device with a dummy gateDONGBU HITEK CO LTD·Filed 2006·Granted May 5, 2009·13 cites·13 claims
- 0281US7919375B2Semiconductor device and method for manufacturing the deviceDONGBU HITEK CO LTD·Filed 2008·Granted Apr 5, 2011·8 cites·14 claims
- 0360US7884399B2Semiconductor device and method of fabricating the sameDONGBU HITEK CO LTD·Filed 2008·Granted Feb 8, 2011·2 cites·18 claims
- 0460US6864126B2Methods of manufacturing semiconductor devicesDONGBU ELECTRONICS CO LTD·Filed 2003·Granted Mar 8, 2005·8 cites·12 claims
- 0559US7737499B2SRAM device having a common contactDONGBU HITEK CO LTD·Filed 2006·Granted Jun 15, 2010·1 cites·8 claims
- 0659US7727844B2Gate structure of a semiconductor deviceDONGBU HITEK CO LTD·Filed 2006·Granted Jun 1, 2010·1 cites·5 claims
- 0756US7642172B2Method of forming isolation layer in semiconductor deviceDONGBU HITEK CO LTD·Filed 2008·Granted Jan 5, 2010·1 cites·11 claims
- 0850US6987038B2Method for fabricating MOS field effect transistorDONGBUANAM SEMICONDUCTOR INC·Filed 2004·Granted Jan 17, 2006·5 cites·14 claims
- 0947US7435669B2Method of fabricating transistor in semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Oct 14, 2008·2 cites·5 claims
- 1046US2009295421A1Test pattern of semiconductor device, method of manufacturing the same, and method of testing device using test patternKIM DAE-KYEUN·Filed 2009·Application pending·0 cites
- 1145US7704820B2Fabricating method of metal lineDONGBU HITEK CO LTD·Filed 2008·Granted Apr 27, 2010·0 cites·20 claims
- 1245US2010127401A1Semiconductor deviceKIM DAE KYEUN·Filed 2009·Application pending·0 cites
- 1344US2009159980A1Semiconductor Device and Method of Fabricating the SameKIM DAE KYEUN·Filed 2008·Application pending·0 cites
- 1444US2009152670A1Semiconductor device and method of fabricating the sameKIM DAE-KYEUN·Filed 2008·Application pending·0 cites
- 1543US7524714B2Method for manufacturing semiconductor deviceDONGBU HITEK CO LTD·Filed 2006·Granted Apr 28, 2009·0 cites·19 claims
- 1643US2009160031A1Semiconductor Device and Method for Fabricating the SameKIM DAE KYEUN·Filed 2008·Application pending·0 cites
- 1743US2009160014A1Semiconductor device and method for manufacturing the sameKIM DAE-KYEUN·Filed 2008·Application pending·0 cites
- 1842US7473627B2Semiconducting device having a structure to improve contact processing margin, and method of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jan 6, 2009·0 cites·16 claims
- 1942US2010117187A1Method for forming gate in fabricating semiconductor deviceKIM DAE-KYEUN·Filed 2009·Application pending·0 cites
- 2041US2009140332A1Semiconductor device and method of fabricating the sameKIM DAE-KYEUN·Filed 2008·Application pending·0 cites
- 2139US2007152279A1Sram deviceKIM DAE KYEUN·Filed 2006·Application pending·0 cites
- 2239US2007023841A1Transistor and method for forming the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2338US2007105295A1Method for forming lightly-doped-drain metal-oxide-semiconductor (LDD MOS) deviceDONGBUANAM SEMICONDUCTOR INC·Filed 2005·Application pending·0 cites
- 2438US2007155110A1Method for manufacturing semiconductor deviceKIM DAE KYEUN·Filed 2006·Application pending·0 cites
- 2538US2007155079A1Gate structure of semiconductor device and method of manufacturing the sameKIM DAE KYEUN·Filed 2006·Application pending·0 cites
- 2637US7300834B2Methods of forming wells in semiconductor devicesDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Nov 27, 2007·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Dae-Kyeun Kim files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →