Inventor · disambiguated record
Dae Sin Kim
Also filed as: KIM DAE-SIN
15 granted patents·6 pending applications·57 citations·filing 2011–2025
90Inventor score
Top patents by PatentIndex Score
21 records- 0188US9035419B2Semiconductor devices including an air-gap and methods of manufacturing the sameOH SANG-WOO·Filed 2011·Granted May 19, 2015·17 cites·24 claims
- 0283US9293180B2Memory device, memory system, and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 22, 2016·10 cites·18 claims
- 0382US8627257B2Method of designing nonvolatile memory deviceKIM JAE-HO·Filed 2012·Granted Jan 7, 2014·8 cites·20 claims
- 0481US9786675B2Non-volatile memory devices including charge storage layersSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 10, 2017·4 cites·19 claims
- 0581US9741735B2Vertical memory devices having charge storage layers with thinned portionsSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 22, 2017·4 cites·18 claims
- 0681US9082850B2Semiconductor device having buried channel arraySAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 14, 2015·5 cites·7 claims
- 0780US12302635B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted May 13, 2025·0 cites·20 claims
- 0879US2025248116A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0979US2025248117A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1078US9859288B2Semiconductor devices including an air-gap and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 2, 2018·3 cites·20 claims
- 1176US9831265B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 28, 2017·3 cites·20 claims
- 1275US2025359180A1Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1370US2023298154A1Wafer map analyzer, method for analyzing wafer map using the same and method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1469US11824059B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Nov 21, 2023·0 cites·20 claims
- 1567US10217205B2Grain analyzing method and system using HRTEM imagePARK MIN CHUL·Filed 2016·Granted Feb 26, 2019·2 cites·20 claims
- 1660US12408379B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 2, 2025·0 cites·20 claims
- 1755US11688050B2Wafer map analyzer, method for analyzing wafer map using the same and method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 27, 2023·0 cites·7 claims
- 1846US9685519B2Semiconductor device having buried channel arraySAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 20, 2017·0 cites·11 claims
- 1946US9099203B2Method for testing retention characteristics of semiconductor device having a volatile device cell and semiconductor test apparatusKIM CHIHO·Filed 2013·Granted Aug 4, 2015·1 cites·26 claims
- 2037US2015115345A1Vertical memory devices and methods of manufacturing the sameNOWAK ETIENNE·Filed 2014·Application pending·0 cites
- 2131US2012223379A1Non-volatile memory devices and methods of manufacturing the sameOH HYUN-SIL·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →