Inventor · disambiguated record
David M. Kranz
Also filed as: KRANZ DAVID M
8 granted patents·237 citations·filing 1997–2010
89Inventor score
Top patents by PatentIndex Score
8 records- 0193US6577405B2Phase profilometry system with telecentric projectorCYBEROPTICS CORP·Filed 2001·Granted Jun 10, 2003·70 cites·24 claims
- 0288US6678062B2Automated system with improved height sensingCYBEROPTICS CORP·Filed 2001·Granted Jan 13, 2004·52 cites·32 claims
- 0386US8670031B2High speed optical inspection system with camera array and compact, integrated illuminatorHAUGAN CARL E·Filed 2010·Granted Mar 11, 2014·15 cites·36 claims
- 0484US6750899B1Solder paste inspection systemCYBEROPTICS CORP·Filed 2000·Granted Jun 15, 2004·38 cites·20 claims
- 0583US7746481B2Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beamCYBEROPTICS CORP·Filed 2008·Granted Jun 29, 2010·18 cites·12 claims
- 0674US6049384AMethod and apparatus for three dimensional imaging using multi-phased structured lightCYBEROPTICS CORP·Filed 1997·Granted Apr 11, 2000·38 cites·33 claims
- 0754US8894259B2Dark field illuminator with large working areaHAUGAN CARL E·Filed 2009·Granted Nov 25, 2014·1 cites·23 claims
- 0852US6909515B2Multiple source alignment sensor with improved opticsCYBEROPTICS CORP·Filed 2003·Granted Jun 21, 2005·5 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →