Inventor · disambiguated record
David S. Kurtz
Also filed as: KURTZ DAVID S
11 granted patents·376 citations·filing 1990–2003
92Inventor score
Top patents by PatentIndex Score
11 records- 0188US5132278ASuperconducting composite article, and method of making the sameADVANCED TECH MATERIALS·Filed 1990·Granted Jul 21, 1992·78 cites·25 claims
- 0287US5784432ALarge angle solid state position sensitive x-ray detector systemPENN STATE RES FOUND·Filed 1997·Granted Jul 21, 1998·77 cites·4 claims
- 0382US6882739B2Method and apparatus for rapid grain size analysis of polycrystalline materialsHYPERNEX INC·Filed 2001·Granted Apr 19, 2005·33 cites·44 claims
- 0479US6678347B1Method and apparatus for quantitative phase analysis of textured polycrystalline materialsHYPERNEX INC·Filed 2002·Granted Jan 13, 2004·20 cites·21 claims
- 0579US5848122AApparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafersADVANCED TECH MATERIALS·Filed 1997·Granted Dec 8, 1998·56 cites·16 claims
- 0672US6301330B1Apparatus and method for texture analysis on semiconductor wafersHYPERNEX INC·Filed 1999·Granted Oct 9, 2001·44 cites·40 claims
- 0764US5828724APhoto-sensor fiber-optic stress analysis systemADVANCED TECH MATERIALS·Filed 1997·Granted Oct 27, 1998·25 cites·22 claims
- 0862US6792075B2Method and apparatus for thin film thickness mappingHYPERNEX INC·Filed 2002·Granted Sep 14, 2004·4 cites·24 claims
- 0958US5724401ALarge angle solid state position sensitive x-ray detector systemPENN STATE RES FOUND·Filed 1996·Granted Mar 3, 1998·24 cites·10 claims
- 1048US6058160APhoto-sensor fiber-optic stress analysis systemHYPERNEX INC·Filed 1998·Granted May 2, 2000·12 cites·20 claims
- 1147US6909772B2Method and apparatus for thin film thickness mappingIBM·Filed 2003·Granted Jun 21, 2005·3 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →