Inventor · disambiguated record
Daniel N. Maynard
Also filed as: MAYNARD DANIEL N · MAYNARD DANIEL NELSON
33 granted patents·3 pending applications·497 citations·filing 1995–2012
97Inventor score
Files withIBM29DEMARIS DAVID L3ELLIS-MONAGHAN JOHN J2BICKFORD JEANNE PAULETTE SPENCE1HIBBELER JASON D1
Top patents by PatentIndex Score
36 records- 0197US7503020B2IC layout optimization to improve yieldIBM·Filed 2006·Granted Mar 10, 2009·110 cites·15 claims
- 0294US7893468B2Optical sensor including stacked photodiodesIBM·Filed 2008·Granted Feb 22, 2011·25 cites·10 claims
- 0394US6738954B1Method for prediction random defect yields of integrated circuits with accuracy and computation time controlsIBM·Filed 2000·Granted May 18, 2004·98 cites·36 claims
- 0492US7883916B2Optical sensor including stacked photosensitive diodesIBM·Filed 2008·Granted Feb 8, 2011·19 cites·20 claims
- 0592US7353472B2System and method for testing pattern sensitive algorithms for semiconductor designIBM·Filed 2005·Granted Apr 1, 2008·14 cites·10 claims
- 0679US6823496B2Physical design characterization systemIBM·Filed 2002·Granted Nov 23, 2004·26 cites·12 claims
- 0777US8405751B2Image sensor pixel structure employing a shared floating diffusionHIBBELER JASON D·Filed 2009·Granted Mar 26, 2013·7 cites·16 claims
- 0877US6394638B1Trench isolation for active areas and first level conductorsIBM·Filed 2000·Granted May 28, 2002·19 cites·10 claims
- 0974US7076749B2Method and system for improving integrated circuit manufacturing productivityIBM·Filed 2004·Granted Jul 11, 2006·22 cites·20 claims
- 1073US5636133AEfficient generation of fill shapes for chips and packagesIBM·Filed 1995·Granted Jun 3, 1997·73 cites·6 claims
- 1169US7404174B2method for generating a set of test patterns for an optical proximity correction algorithmIBM·Filed 2004·Granted Jul 22, 2008·11 cites·7 claims
- 1269US7404164B2IC design modeling allowing dimension-dependent rule checkingIBM·Filed 2004·Granted Jul 22, 2008·10 cites·7 claims
- 1368US5734192ATrench isolation for active areas and first level conductorsIBM·Filed 1995·Granted Mar 31, 1998·29 cites·20 claims
- 1467US7415695B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2007·Granted Aug 19, 2008·3 cites·19 claims
- 1566US7703061B2IC design modeling allowing dimension-dependent rule checkingIBM·Filed 2008·Granted Apr 20, 2010·2 cites·15 claims
- 1665US8704325B2Pixel sensors of multiple pixel size and methods of implant dose controlELLIS-MONAGHAN JOHN J·Filed 2012·Granted Apr 22, 2014·0 cites·14 claims
- 1765US7584077B2Physical design characterization systemIBM·Filed 2004·Granted Sep 1, 2009·11 cites·8 claims
- 1864US8201132B2System and method for testing pattern sensitive algorithms for semiconductor designDEMARIS DAVID L·Filed 2009·Granted Jun 12, 2012·1 cites·8 claims
- 1964US7818694B2IC layout optimization to improve yieldIBM·Filed 2008·Granted Oct 19, 2010·2 cites·20 claims
- 2062US8334195B2Pixel sensors of multiple pixel size and methods of implant dose controlELLIS-MONAGHAN JOHN J·Filed 2009·Granted Dec 18, 2012·0 cites·19 claims
- 2162US7555735B2IC design modeling allowing dimension-dependent rule checkingIBM·Filed 2007·Granted Jun 30, 2009·1 cites·13 claims
- 2262US7389480B2Content based yield prediction of VLSI designsIBM·Filed 2005·Granted Jun 17, 2008·2 cites·6 claims
- 2360US7284230B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2003·Granted Oct 16, 2007·6 cites·21 claims
- 2459US7661081B2Content based yield prediction of VLSI designsIBM·Filed 2008·Granted Feb 9, 2010·1 cites·14 claims
- 2559US2011072409A1Optical sensor including stacked photodiodesIBM·Filed 2010·Application pending·0 cites
- 2656US7685544B2Testing pattern sensitive algorithms for semiconductor designIBM·Filed 2007·Granted Mar 23, 2010·0 cites·10 claims
- 2754US7577927B2IC design modeling allowing dimension-dependent rule checkingIBM·Filed 2008·Granted Aug 18, 2009·0 cites·12 claims
- 2850US7552417B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2008·Granted Jun 23, 2009·0 cites·7 claims
- 2950US2008247633A1System for generating a set of test patterns for an optical proximity correction algorithmDEMARIS DAVID L·Filed 2008·Application pending·0 cites
- 3049US7752580B2Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing techniqueIBM·Filed 2007·Granted Jul 6, 2010·0 cites·20 claims
- 3148US7752589B2Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit designIBM·Filed 2007·Granted Jul 6, 2010·0 cites·32 claims
- 3247US8136066B2Apparatus and computer program product for semiconductor yield estimationBICKFORD JEANNE PAULETTE SPENCE·Filed 2008·Granted Mar 13, 2012·0 cites·21 claims
- 3345US7398485B2Yield optimization in router for systematic defectsIBM·Filed 2006·Granted Jul 8, 2008·0 cites·17 claims
- 3443US2008320421A1Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layoutDEMARIS DAVID L·Filed 2007·Application pending·0 cites
- 3530US6063687AFormation of trench isolation for active areas and first level conductorsIBM·Filed 1997·Granted May 16, 2000·0 cites·12 claims
- 3630US6021267AAspect ratio program for optimizing semiconductor chip shapeIBM·Filed 1997·Granted Feb 1, 2000·5 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →