Inventor · disambiguated record
David K. Nelson
Also filed as: NELSON DAVID · NELSON DAVID K
7 granted patents·4 pending applications·31 citations·filing 2002–2021
79Inventor score
Top patents by PatentIndex Score
11 records- 0173US8963590B2Power cycling power on reset circuit for fuse initialization circuitryGUIMONT JOE G·Filed 2009·Granted Feb 24, 2015·12 cites·32 claims
- 0264US7693001B2SRAM split write control for a delay elementHONEYWELL INT INC·Filed 2008·Granted Apr 6, 2010·5 cites·5 claims
- 0362US6909637B2Full rail drive enhancement to differential SEU hardening circuit while loading dataHONEYWELL INT INC·Filed 2002·Granted Jun 21, 2005·13 cites·56 claims
- 0452US9165633B2Carbon nanotube memory cell with enhanced current controlHONEYWELL INT INC·Filed 2013·Granted Oct 20, 2015·1 cites·14 claims
- 0542US11614995B2Dual redundant memory radiation hardeningHONEYWELL INT INC·Filed 2021·Granted Mar 28, 2023·0 cites·20 claims
- 0641US9842991B2Memory cell with redundant carbon nanotubeHONEYWELL INT INC·Filed 2013·Granted Dec 12, 2017·0 cites·9 claims
- 0736US2007279964A1SRAM split write control for a delay elementHONEYWELL INT INC·Filed 2006·Application pending·0 cites
- 0836US2007096754A1Method and system for analyzing single event upset in semiconductor devicesHONEYWELL INT INC·Filed 2005·Application pending·0 cites
- 0935US2015117087A1Self-terminating write for a memory cellHONEYWELL INT INC·Filed 2013·Application pending·0 cites
- 1033US8767444B2Radiation-hardened memory element with multiple delay elementsNELSON DAVID·Filed 2006·Granted Jul 1, 2014·0 cites·7 claims
- 1131US2008309384A1Initialization Circuitry Having Fuse Leakage Current ToleranceHONEYWELL INT INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →