Inventor · disambiguated record
David Palsulich
Also filed as: PALSULICH DAVID · PALSULICH DAVID A
6 granted patents·2 pending applications·24 citations·filing 1999–2021
79Inventor score
Top patents by PatentIndex Score
8 records- 0187US11742230B2Contaminant detection tools including nebulizer and related methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 29, 2023·2 cites·22 claims
- 0283US9196471B1Scanner for wafers, method for using the scanner, and components of the scannerCHOO YEN FUI·Filed 2012·Granted Nov 24, 2015·9 cites·27 claims
- 0370US8765000B2Microfeature workpiece processing system for, e.g., semiconductor wafer analysisPALSULICH DAVID A·Filed 2010·Granted Jul 1, 2014·4 cites·19 claims
- 0455US11211272B2Contaminant detection tools and related methodsMICRON TECHNOLOGY INC·Filed 2019·Granted Dec 28, 2021·0 cites·26 claims
- 0548US7763548B2Microfeature workpiece processing system for, e.g., semiconductor wafer analysisMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 27, 2010·3 cites·18 claims
- 0645US2006191866A1Microfeature workpiece processing system for, e.g., semiconductor wafer analysisMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 0742US2006071177A1Transfer line for measurement systemsPALSULICH DAVID·Filed 2005·Application pending·0 cites
- 0840US7002144B1Transfer line for measurement systemsMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 21, 2006·6 cites·41 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →