Inventor · disambiguated record
Daniel Woodrow Phifer, Jr.
Also filed as: PHIFER JR DANIEL W · PHIFER JR DANIEL WOODROW
4 granted patents·51 citations·filing 2006–2013
74Inventor score
Top patents by PatentIndex Score
4 records- 0192US7442924B2Repetitive circumferential milling for sample preparationFEI CO·Filed 2006·Granted Oct 28, 2008·41 cites·31 claims
- 0274US8698078B2Charged-particle microscopy with occlusion detectionPHIFER JR DANIEL WOODROW·Filed 2012·Granted Apr 15, 2014·5 cites·11 claims
- 0371US9070533B2Environmental scanning electron microscope (ESEM/SEM) gas injection apparatus with anode integrated with gas concentrating structureFEI CO·Filed 2013·Granted Jun 30, 2015·3 cites·22 claims
- 0456US8389936B2Method for inspecting a sampleFREITAG BERT HENNING·Filed 2010·Granted Mar 5, 2013·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →