Inventor · disambiguated record
David J. Ray
Also filed as: RAY DAVID · RAY DAVID J · RAY DAVID J M · RAY DAVID JAMES
23 granted patents·5 pending applications·513 citations·filing 1975–2017
97Inventor score
Top patents by PatentIndex Score
28 records- 0194US7323699B2Apparatus and method for modifying an objectRAVE LLC·Filed 2005·Granted Jan 29, 2008·32 cites·23 claims
- 0292US4488240AVibration monitoring system for aircraft enginesBECTON DICKINSON CO·Filed 1982·Granted Dec 11, 1984·81 cites·12 claims
- 0387US3986127AIntegrated feedback active filter/integratorUS AIR FORCE·Filed 1975·Granted Oct 12, 1976·26 cites·3 claims
- 0485US7495240B2Apparatus and method for modifying an objectRAVE LLC·Filed 2006·Granted Feb 24, 2009·9 cites·53 claims
- 0584US7692138B1Integrated scanning probe microscope and confocal microscopeRAY DAVID JAMES·Filed 2007·Granted Apr 6, 2010·19 cites·8 claims
- 0684US5388452ADetection system for atomic force microscopesQUESANT INSTR CORP·Filed 1993·Granted Feb 14, 1995·53 cites·26 claims
- 0783US4649267AAutomatic gain control circuit for encoderILC TECHNOLOGY INC·Filed 1984·Granted Mar 10, 1987·31 cites·7 claims
- 0879US4613693AProcess for the co-production of a C2 to C10 monocarboxylic acid and formic acidBP CHEM INT LTD·Filed 1982·Granted Sep 23, 1986·14 cites·9 claims
- 0973US6748794B2Method for replacing a probe sensor assembly on a scanning probe microscopeFiled 2002·Granted Jun 15, 2004·14 cites·20 claims
- 1071US6138503AScanning probe microscope system including removable probe sensor assemblyRAYMAX TECHNOLOGY INC·Filed 1999·Granted Oct 31, 2000·28 cites·15 claims
- 1170US6910368B2Removable probe sensor assembly and scanning probe microscopeRAYMAX TECHNOLOGY INC·Filed 2004·Granted Jun 28, 2005·12 cites·20 claims
- 1270US5357105ALight modulated detection system for atomic force microscopesQUESANT INSTR CORP·Filed 1993·Granted Oct 18, 1994·33 cites·11 claims
- 1368US5861550AScanning force microscopeRAYMAX TECHNOLOGY INC·Filed 1997·Granted Jan 19, 1999·29 cites·10 claims
- 1462US5466935AProgrammable, scanned-probe microscope system and methodQUESANT INSTR CORP·Filed 1995·Granted Nov 14, 1995·28 cites·39 claims
- 1559US4081744AResistance bridge transducer conditioning circuitUS AIR FORCE·Filed 1976·Granted Mar 28, 1978·12 cites·2 claims
- 1657US6415654B1Scanning probe microscope system including removable probe sensor assemblyFiled 2000·Granted Jul 9, 2002·6 cites·17 claims
- 1754US5874669AScanning force microscope with removable probe illuminator assemblyRAYMAX TECHNOLOGY INC·Filed 1997·Granted Feb 23, 1999·18 cites·21 claims
- 1854US5614712AMethod of engaging the scanning probe of a scanning probe microscope with a sample surfaceQUESANT INSTR CORP·Filed 1995·Granted Mar 25, 1997·19 cites·14 claims
- 1954US2009114850A1Apparatus and method for modifying an objectRAVE LLC·Filed 2009·Application pending·0 cites
- 2053US5831264AElectrostrictive actuator for scanned-probe microscopeBURLEIGH INSTR·Filed 1996·Granted Nov 3, 1998·13 cites·27 claims
- 2149US4506551ATransducer selecting systemBECTON DICKINSON CO·Filed 1982·Granted Mar 26, 1985·9 cites·14 claims
- 2245US6189373B1Scanning force microscope and method for beam detection and alignmentRAY MAX TECHNOLOGY INC·Filed 1998·Granted Feb 20, 2001·12 cites·17 claims
- 2341US2003154072A1Call analysisSCANSOFT INC A DELAWARE CORP·Filed 2003·Application pending·0 cites
- 2440US5524479ADetecting system for scanning microscopesOUESANT INSTR CORP·Filed 1995·Granted Jun 11, 1996·11 cites·31 claims
- 2540US2007144244A1Probe module with integrated actuator for a probe microscopeKARMA TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 2639US2019168534A1CNC Marking DevicePRYOR EDWARD & SON·Filed 2017·Application pending·0 cites
- 2733USRE37404EDetection system for atomic force microscopesQUESANT INSTR CORP·Filed 1997·Granted Oct 9, 2001·4 cites·59 claims
- 2827US2005180804A1System for marking components and for verifying the applied markingFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →