Inventor · disambiguated record
Daisuke Shiraishi
Also filed as: SHIRAISHI DAISUKE
65 granted patents·25 pending applications·243 citations·filing 2001–2024
98Inventor score
Top patents by PatentIndex Score
90 records- 0192US9324588B2Data analysis method for plasma processing apparatus, plasma processing method and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 26, 2016·7 cites·6 claims
- 0292US8098325B2Digital cameraKANEKO SHUHEI·Filed 2008·Granted Jan 17, 2012·14 cites·9 claims
- 0392US6616759B2Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system thereforHITACHI LTD·Filed 2001·Granted Sep 9, 2003·58 cites·9 claims
- 0489US9110461B2Semiconductor manufacturing equipmentMORISAWA TOSHIHIRO·Filed 2012·Granted Aug 18, 2015·13 cites·14 claims
- 0586US11842079B2Memory controller and memory control method that decides an order of issuing dram commands based on whether a command has a penalty periodCANON KK·Filed 2022·Granted Dec 12, 2023·1 cites·15 claims
- 0686US9443704B2Data analysis method for plasma processing apparatus, plasma processing method and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 13, 2016·4 cites·3 claims
- 0784US10510519B2Plasma processing apparatus and data analysis apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 17, 2019·3 cites·8 claims
- 0883US11410836B2Analysis method and semiconductor etching apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 9, 2022·2 cites·6 claims
- 0983US8992721B2Plasma processing apparatusKAGOSHIMA AKIRA·Filed 2010·Granted Mar 31, 2015·7 cites·9 claims
- 1080US9091595B2Analysis method, analysis device, and etching processing systemHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 28, 2015·4 cites·6 claims
- 1179US8924001B2Etching apparatus, control simulator, and semiconductor device manufacturing methodMORISAWA TOSHIHIRO·Filed 2010·Granted Dec 30, 2014·5 cites·21 claims
- 1279US7343217B2System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equationHITACHI LTD·Filed 2006·Granted Mar 11, 2008·4 cites·5 claims
- 1378US7330346B2Etching apparatus, method for measuring self-bias voltage, and method for monitoring etching apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Feb 12, 2008·6 cites·12 claims
- 1477US8828184B2Plasma processing apparatus and plasma processing methodKAGOSHIMA AKIRA·Filed 2012·Granted Sep 9, 2014·4 cites·5 claims
- 1577US7962678B2Bus arbitration apparatus and methodCANON KK·Filed 2007·Granted Jun 14, 2011·7 cites·12 claims
- 1677US6706543B2Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a thereforHITACHI LTD·Filed 2002·Granted Mar 16, 2004·13 cites·7 claims
- 1776US10495842B2Lens barrelCANON KK·Filed 2017·Granted Dec 3, 2019·2 cites·10 claims
- 1876US9464936B2Plasma processing apparatus and analyzing apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 11, 2016·3 cites·9 claims
- 1975US10262842B2Analysis method and semiconductor etching apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 16, 2019·2 cites·8 claims
- 2075US8140727B2Bus arbitration apparatus and methodMINAMI TOSHIAKI·Filed 2011·Granted Mar 20, 2012·4 cites·8 claims
- 2175US7058470B2Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system thereforHITACHI LTD·Filed 2004·Granted Jun 6, 2006·11 cites·9 claims
- 2274US8486290B2Etching apparatus, analysis apparatus, etching treatment method, and etching treatment programMORISAWA TOSHIHIRO·Filed 2009·Granted Jul 16, 2013·5 cites·13 claims
- 2373US10872750B2Plasma processing apparatus and plasma processing systemHITACHI HIGH TECH CORP·Filed 2018·Granted Dec 22, 2020·1 cites·6 claims
- 2473US10734207B2Plasma processing apparatus and analysis method for analyzing plasma processing dataHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 4, 2020·1 cites·9 claims
- 2573US6828165B2Semiconductor plasma processing apparatus with first and second processing state monitoring unitsHITACHI LTD·Filed 2003·Granted Dec 7, 2004·10 cites·3 claims
- 2671US11643727B2Plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted May 9, 2023·0 cites·9 claims
- 2771US2022328286A1Analysis method and semiconductor etching apparatusHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2870US12466408B2Driving assistance device, driving assistance method, and programTOYOTA MOTOR CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·10 claims
- 2970US11404253B2Plasma processing apparatus and analysis method for analyzing plasma processing dataHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 2, 2022·0 cites·6 claims
- 3070US11289313B2Plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 29, 2022·1 cites·8 claims
- 3169US10153217B2Plasma processing apparatus and plasma processing methodHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 11, 2018·1 cites·7 claims
- 3269US8083960B2Etching endpoint determination methodUCHIDA HIROSHIGE·Filed 2008·Granted Dec 27, 2011·4 cites·3 claims
- 3368US8341453B2Transmission apparatus that transmits data according to a protocol, and method for measuring time in the transmission apparatusSHIRAISHI DAISUKE·Filed 2008·Granted Dec 25, 2012·4 cites·10 claims
- 3468US8282849B2Etching process state judgment method and system thereforMORISAWA TOSHIHIRO·Filed 2009·Granted Oct 9, 2012·3 cites·9 claims
- 3568US7839583B2Cam follower for lens barrel and lens barrelOLYMPUS IMAGING CORP·Filed 2008·Granted Nov 23, 2010·4 cites·12 claims
- 3668US7515360B2Lens barrel and lens barrel systemOLYMPUS CORP·Filed 2006·Granted Apr 7, 2009·4 cites·7 claims
- 3766US9824866B2Plasma processing methodHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·1 cites·7 claims
- 3866US7166480B2Particle control device and particle control method for vacuum processing apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 23, 2007·10 cites·14 claims
- 3965US8737393B2Communication apparatus, control method for communication apparatus, and computer programSHIRAISHI DAISUKE·Filed 2010·Granted May 27, 2014·2 cites·10 claims
- 4064US12445748B2Image signal processor and imaging system including the sameSK HYNIX INC·Filed 2024·Granted Oct 14, 2025·0 cites·20 claims
- 4164US12014909B2Plasma processing apparatus and plasma processing systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 18, 2024·0 cites·1 claims
- 4263US11538671B2Plasma processing apparatus and data analysis apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 27, 2022·0 cites·5 claims
- 4363US11435951B2DRAM access technique to reduce latency due to write command lengthCANON KK·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 4463US7720979B2Communication apparatusCANON KK·Filed 2007·Granted May 18, 2010·2 cites·4 claims
- 4563US6908529B2Plasma processing apparatus and methodHITACHI HIGH TECH CORP·Filed 2002·Granted Jun 21, 2005·8 cites·14 claims
- 4660US12211541B2Memory controller, control method for memory controller, and storage mediumCANON KK·Filed 2022·Granted Jan 28, 2025·0 cites·8 claims
- 4760US2024284073A1Electronic device, electronic system including the same and operating method of the electronic systemSK HYNIX INC·Filed 2023·Application pending·0 cites
- 4859US11290647B2Lens apparatus, image pickup apparatus, and camera systemCANON KK·Filed 2019·Granted Mar 29, 2022·0 cites·13 claims
- 4959US9268725B2Data transferring apparatus and data transferring methodCANON KK·Filed 2012·Granted Feb 23, 2016·1 cites·8 claims
- 5058US2024370173A1Memory controller, control method for memory controller, and storage mediumCANON KK·Filed 2024·Application pending·0 cites
Showing the top 50 of 90 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →