Inventor · disambiguated record
David Sliwinski
Also filed as: SLIWINSKI DAVID
3 granted patents·17 citations·filing 2006–2010
65Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0181US7496816B2Isolating the location of defects in scan chainsCADENCE DESIGN SYSTEM INC·Filed 2006·Granted Feb 24, 2009·13 cites·26 claims
- 0260US7821276B2Method and article of manufacture to generate IC test vector for synchronized physical probingCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Oct 26, 2010·3 cites·9 claims
- 0355US8120378B2System to control insertion of care-bits in an IC test vector improved optical probingSWENTON JOSEPH·Filed 2010·Granted Feb 21, 2012·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →