Inventor · disambiguated record
Daniel Tang
Also filed as: TANG DANIEL · TANG DANIEL N
27 granted patents·5 pending applications·564 citations·filing 1987–2024
96Inventor score
Top patents by PatentIndex Score
32 records- 0197US11094499B1Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lensCHEN ZHONGWEI·Filed 2021·Granted Aug 17, 2021·5 cites·20 claims
- 0295US9450078B1Forming punch-through stopper regions in finFET devicesADVANCED ION BEAM TECH INC·Filed 2015·Granted Sep 20, 2016·20 cites·28 claims
- 0394US8685825B2Replacement source/drain finFET fabricationTANG DANIEL·Filed 2011·Granted Apr 1, 2014·22 cites·19 claims
- 0493US11257659B1Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the sameCHEN ZHONGWEI·Filed 2021·Granted Feb 22, 2022·2 cites·9 claims
- 0593US5731242ASelf-aligned contact process in semiconductor fabricationINTEL CORP·Filed 1995·Granted Mar 24, 1998·147 cites·23 claims
- 0690US8871584B2Replacement source/drain finFET fabricationTANG DANIEL·Filed 2012·Granted Oct 28, 2014·12 cites·18 claims
- 0789US11664189B2Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereofBORRIES PTE LTD·Filed 2022·Granted May 30, 2023·1 cites·20 claims
- 0889US11569059B2Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereofCHEN ZHONGWEI·Filed 2021·Granted Jan 31, 2023·1 cites·18 claims
- 0989US9209278B2Replacement source/drain finFET fabricationADVANCED ION BEAM TECH INC·Filed 2014·Granted Dec 8, 2015·8 cites·20 claims
- 1088US11664186B1Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interactionBORRIES PTE LTD·Filed 2022·Granted May 30, 2023·1 cites·20 claims
- 1184US11593938B2Rapid and automatic virus imaging and analysis system as well as methods thereofCHEN ZHONGWEI·Filed 2021·Granted Feb 28, 2023·1 cites·23 claims
- 1283US8211784B2Method for manufacturing a semiconductor device with less leakage current induced by carbon implantHONG JASON·Filed 2009·Granted Jul 3, 2012·13 cites·7 claims
- 1381US5120671AProcess for self aligning a source region with a field oxide region and a polysilicon gateINTEL CORP·Filed 1990·Granted Jun 9, 1992·75 cites·16 claims
- 1480US9159810B2Doping a non-planar semiconductor deviceTANG DANIEL·Filed 2012·Granted Oct 13, 2015·5 cites·26 claims
- 1580US6194784B1Self-aligned contact process in semiconductor fabrication and device therefromINTEL CORP·Filed 1997·Granted Feb 27, 2001·53 cites·11 claims
- 1678US9006065B2Plasma doping a non-planar semiconductor deviceADVANCED ION BEAM TECH INC·Filed 2012·Granted Apr 14, 2015·4 cites·23 claims
- 1778US5190887AMethod of making electrically erasable and electrically programmable memory cell with extended cycling enduranceINTEL CORP·Filed 1991·Granted Mar 2, 1993·66 cites·15 claims
- 1876US11355312B2Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the sameCHEN ZHONGWEI·Filed 2021·Granted Jun 7, 2022·0 cites·18 claims
- 1976US11328898B2Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereofCHEN ZHONGWEI·Filed 2021·Granted May 10, 2022·0 cites·19 claims
- 2075US11295927B1Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuningCHEN ZHONGWEI·Filed 2021·Granted Apr 5, 2022·0 cites·14 claims
- 2170US11854763B1Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereofBORRIES PTE LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 2270US5229311AMethod of reducing hot-electron degradation in semiconductor devicesINTEL CORP·Filed 1992·Granted Jul 20, 1993·49 cites·20 claims
- 2363US5103274ASelf-aligned source process and apparatusINTEL CORP·Filed 1991·Granted Apr 7, 1992·34 cites·5 claims
- 2462US11854762B1MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the sameBORRIES PTE LTD·Filed 2023·Granted Dec 26, 2023·0 cites·18 claims
- 2561US2024362778A1Rapid and automatic virus imaging and analysis system as well as methods thereofBORRIES PTE LTD·Filed 2024·Application pending·0 cites
- 2659US4806202AField enhanced tunnel oxide on treated substratesINTEL CORP·Filed 1987·Granted Feb 21, 1989·18 cites·11 claims
- 2755US2023170178A1Rapid and automatic virus imaging and analysis system as well as methods thereofBORRIES PTE LTD·Filed 2023·Application pending·0 cites
- 2845US4818711AHigh quality oxide on an ion implanted polysilicon surfaceINTEL CORP·Filed 1987·Granted Apr 4, 1989·14 cites·21 claims
- 2943US5466624AIsolation between diffusion lines in a memory arrayINTEL CORP·Filed 1994·Granted Nov 14, 1995·13 cites·20 claims
- 3042US2006163490A1Ion implantation cooling systemADVANCED ION BEAM TECHNOLOGY I·Filed 2006·Application pending·0 cites
- 3137US2005019697A1Method of treating wafers with photoresist to perform metrology analysis using large current e-beam systemsADVANCED ION BEAM TECHNOLOGY I·Filed 2003·Application pending·0 cites
- 3233US2016233047A1Plasma-based material modification with neutral beamADVANCED ION BEAM TECH INC·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Daniel Tang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →