Inventor · disambiguated record
Darryl G. Walker
Also filed as: WALKER DARRYL · WALKER DARRYL G · WALKER DARRYL GENE
97 granted patents·7 pending applications·1,076 citations·filing 1993–2025
99Inventor score
Files withWALKER DARRYL G55MAVAGAIL TECH LLC12SAMSUNG ELECTRONICS CO LTD10TEXAS INSTRUMENTS INC9WALKER DARRYL7
Top patents by PatentIndex Score
104 records- 0199US11515871B2Temperature sensor circuits for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2021·Granted Nov 29, 2022·6 cites·20 claims
- 0299US11381235B2Temperature sensor circuits for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2021·Granted Jul 5, 2022·5 cites·20 claims
- 0399US11368016B2ESD protection for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2020·Granted Jun 21, 2022·7 cites·19 claims
- 0499US7383149B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2006·Granted Jun 3, 2008·69 cites·17 claims
- 0598US11777486B2Temperature sensor circuits for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2022·Granted Oct 3, 2023·3 cites·20 claims
- 0698US9286991B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2015·Granted Mar 15, 2016·29 cites·20 claims
- 0798US8497453B2Semiconductor device having variable parameter selection based on temperatureWALKER DARRYL G·Filed 2011·Granted Jul 30, 2013·18 cites·20 claims
- 0898US7953573B2Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2010·Granted May 31, 2011·27 cites·31 claims
- 0998US7480588B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Jan 20, 2009·56 cites·70 claims
- 1097US9711500B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Jul 18, 2017·18 cites·20 claims
- 1197US8308359B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2010·Granted Nov 13, 2012·18 cites·22 claims
- 1297US8081532B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2010·Granted Dec 20, 2011·18 cites·20 claims
- 1397US7654736B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2008·Granted Feb 2, 2010·41 cites·19 claims
- 1497US7639548B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2009·Granted Dec 29, 2009·28 cites·20 claims
- 1597US7603249B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Oct 13, 2009·41 cites·19 claims
- 1697US7535786B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted May 19, 2009·42 cites·20 claims
- 1796US9940999B2Semiconductor devices, circuits and methods for read and/or write assist of an SRAM circuit portion based on voltage detection and/or temperature detection circuitsWALKER DARRYL G·Filed 2017·Granted Apr 10, 2018·15 cites·20 claims
- 1896US9194754B2Power up of semiconductor device having a temperature circuit and method thereforWALKER DARRYL G·Filed 2014·Granted Nov 24, 2015·10 cites·18 claims
- 1996US7760570B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Jul 20, 2010·30 cites·10 claims
- 2095US8049145B1Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2007·Granted Nov 1, 2011·24 cites·13 claims
- 2194US11955171B2Integrated circuit device including an SRAM portion having end power select circuitsMAVAGAIL TECH LLC·Filed 2022·Granted Apr 9, 2024·2 cites·19 claims
- 2294US7720627B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2008·Granted May 18, 2010·21 cites·18 claims
- 2393US11689198B2Temperature sensor circuits for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2022·Granted Jun 27, 2023·1 cites·20 claims
- 2493US9613719B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2015·Granted Apr 4, 2017·6 cites·18 claims
- 2592US11641105B2ESD protection for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2022·Granted May 2, 2023·1 cites·20 claims
- 2692US10605672B2Semiconductor device having temperature circuit that sets temperature ranges and is disabled upon power supply transitionSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 31, 2020·2 cites·20 claims
- 2792US9378778B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2015·Granted Jun 28, 2016·5 cites·20 claims
- 2892US8005641B2Temperature sensing circuit with hysteresis and time delayAGERSONN RALL GROUP LLC·Filed 2009·Granted Aug 23, 2011·15 cites·16 claims
- 2992US6064589ADouble gate DRAM memory cellFiled 1998·Granted May 16, 2000·75 cites·20 claims
- 3091US10128215B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Nov 13, 2018·5 cites·19 claims
- 3190US9929127B1Package including a plurality of stacked semiconductor devices an interposer and interface connectionsWALKER DARRYL G·Filed 2017·Granted Mar 27, 2018·3 cites·20 claims
- 3290US9645191B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2014·Granted May 9, 2017·9 cites·19 claims
- 3390US8040742B2Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2009·Granted Oct 18, 2011·12 cites·21 claims
- 3488US9274007B2Semiconductor device having temperature sensor circuitsWALKER DARRYL G·Filed 2014·Granted Mar 1, 2016·5 cites·19 claims
- 3586US12184271B2Temperature sensor circuits for integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Dec 31, 2024·0 cites·20 claims
- 3686US10163524B2Testing a semiconductor device including a voltage detection circuit and temperature detection circuit that can be used to generate read assist and/or write assist in an SRAM circuit portion and method thereforWALKER DARRYL G·Filed 2017·Granted Dec 25, 2018·5 cites·20 claims
- 3786US9997513B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2017·Granted Jun 12, 2018·3 cites·20 claims
- 3885US12119641B2ESD protection for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2023·Granted Oct 15, 2024·0 cites·20 claims
- 3985US10134720B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Nov 20, 2018·3 cites·20 claims
- 4085US6207985B1DRAM memory cell and array having pass transistors with surrounding gateTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 27, 2001·62 cites·35 claims
- 4184US11949408B2Temperature sensor circuits for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 4284US9455189B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2015·Granted Sep 27, 2016·2 cites·20 claims
- 4383US12401192B2ESD protection for integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 4483US11973342B2ESD protection for integrated circuit devicesMAVAGAIL TECH LLC·Filed 2023·Granted Apr 30, 2024·0 cites·20 claims
- 4583US10418346B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2018·Granted Sep 17, 2019·2 cites·20 claims
- 4683US10365318B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 4783US9766135B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2012·Granted Sep 19, 2017·2 cites·17 claims
- 4883US6046943ASynchronous semiconductor device output circuit with reduced data switchingTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 4, 2000·55 cites·22 claims
- 4981US9810585B2Semiconductor device having a temperature circuit that provides a plurality of temperature operating rangesWALKER DARRYL G·Filed 2014·Granted Nov 7, 2017·2 cites·20 claims
- 5079US5548225ABlock specific spare circuitTEXAS INSTR INCORPORTATED·Filed 1994·Granted Aug 20, 1996·48 cites·14 claims
Showing the top 50 of 104 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →