Inventor · disambiguated record
Deana Delp
Also filed as: DELP DEANA · DELP DEANA R
4 granted patents·5 pending applications·18 citations·filing 2002–2018
70Inventor score
Top patents by PatentIndex Score
9 records- 0159US7154256B2Integrated VI probeTOKYO ELECTRON LTD·Filed 2003·Granted Dec 26, 2006·9 cites·19 claims
- 0256US7158845B2Man-machine interface for monitoring and controlling a processTOKYO ELECTRON LTD·Filed 2002·Granted Jan 2, 2007·7 cites·29 claims
- 0344US7115211B2Endpoint detection using laser interferometryTOKYO ELECTRON LTD·Filed 2004·Granted Oct 3, 2006·2 cites·7 claims
- 0442US11853899B2Methods and apparatus for data analysisIN DEPTH TEST LLC·Filed 2018·Granted Dec 26, 2023·0 cites·5 claims
- 0541US2006259198A1Intelligent system for detection of process status, process fault and preventive maintenanceTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 0640US2004250108A1Facility monitorFiled 2002·Application pending·0 cites
- 0738US2005199341A1Method and system for analyzing data from a plasma processTOKYO ELECTRON LTD·Filed 2005·Application pending·0 cites
- 0834US2016026915A1Methods and Apparatus for Data AnalysisIN DEPTH TEST LLC·Filed 2015·Application pending·0 cites
- 0932US2011178967A1Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →