Inventor · disambiguated record
Devanathan Varadarajan
Also filed as: VARADARAJAN DEVANATHAN
25 granted patents·8 pending applications·72 citations·filing 2005–2025
94Inventor score
Files withTEXAS INSTRUMENTS INC33
Top patents by PatentIndex Score
33 records- 0194US11436090B2Non-volatile memory compression for memory repairTEXAS INSTRUMENTS INC·Filed 2020·Granted Sep 6, 2022·3 cites·21 claims
- 0288US10134483B2Centralized built-in soft-repair architecture for integrated circuits with embedded memoriesTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 20, 2018·11 cites·17 claims
- 0385US11568951B2Screening of memory circuitsTEXAS INSTRUMENTS INC·Filed 2020·Granted Jan 31, 2023·2 cites·17 claims
- 0485US10600495B2Parallel memory self-testingTEXAS INSTRUMENTS INC·Filed 2018·Granted Mar 24, 2020·8 cites·20 claims
- 0585US9852810B2Optimizing fuseROM usage for memory repairTEXAS INSTRUMENTS INC·Filed 2015·Granted Dec 26, 2017·8 cites·19 claims
- 0682US9053799B2Optimizing fuseROM usage for memory repairTEXAS INSTRUMENTS INC·Filed 2013·Granted Jun 9, 2015·8 cites·18 claims
- 0780US7277803B2Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan testsTEXAS INSTRUMENTS INC·Filed 2006·Granted Oct 2, 2007·11 cites·13 claims
- 0877US2025225034A1Non-volatile memory compression for memory repairTEXAS INSTRUMENTS INC·Filed 2025·Application pending·0 cites
- 0976US12259789B2Non-volatile memory compression for memory repairTEXAS INSTRUMENTS INC·Filed 2023·Granted Mar 25, 2025·0 cites·20 claims
- 1076US12243603B2At-speed test of functional memory interface logic in devicesTEXAS INSTRUMENTS INC·Filed 2023·Granted Mar 4, 2025·0 cites·21 claims
- 1176US11748202B2Non-volatile memory compression for memory repairTEXAS INSTRUMENTS INC·Filed 2022·Granted Sep 5, 2023·0 cites·20 claims
- 1275US2025123903A1Distributed mechanism for fine-grained test power controlTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 1374US9318222B2Hierarchical, distributed built-in self-repair solutionTEXAS INSTRUMENTS INC·Filed 2013·Granted Apr 19, 2016·7 cites·25 claims
- 1473US12033711B2Built-in memory repair with repair code compressionTEXAS INSTRUMENTS INC·Filed 2023·Granted Jul 9, 2024·0 cites·20 claims
- 1573US2025218524A1Memory bist circuit and methodTEXAS INSTRUMENTS INC·Filed 2025·Application pending·0 cites
- 1668US2024345160A1Methods and apparatus to identify faults in processorsTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 1767US12283332B2Memory BIST circuit and methodTEXAS INSTRUMENTS INC·Filed 2022·Granted Apr 22, 2025·0 cites·25 claims
- 1867US11881275B2Screening of memory circuitsTEXAS INSTRUMENTS INC·Filed 2022·Granted Jan 23, 2024·0 cites·16 claims
- 1967US8051347B2Scan-enabled method and system for testing a system-on-chipTEXAS INSTRUMENTS INC·Filed 2009·Granted Nov 1, 2011·8 cites·19 claims
- 2066US12009045B2Management of multiple memory in-field self-repair optionsTEXAS INSTRUMENTS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 2165US12085610B2Methods and apparatus to identify faults in processorsTEXAS INSTRUMENTS INC·Filed 2022·Granted Sep 10, 2024·0 cites·20 claims
- 2265US11631472B2Built-in memory repair with repair code compressionTEXAS INSTRUMENTS INC·Filed 2020·Granted Apr 18, 2023·0 cites·26 claims
- 2364US12217102B2Distributed mechanism for fine-grained test power controlTEXAS INSTRUMENTS INC·Filed 2021·Granted Feb 4, 2025·0 cites·20 claims
- 2463US11373726B2Management of multiple memory in-field self-repair optionsTEXAS INSTRUMENTS INC·Filed 2019·Granted Jun 28, 2022·1 cites·18 claims
- 2561US12147697B2Methods and apparatus to characterize memoryTEXAS INSTRUMENTS INC·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 2661US9698779B2Reconfiguring an ASIC at runtimeTEXAS INSTRUMENTS INC·Filed 2014·Granted Jul 4, 2017·2 cites·20 claims
- 2761US2021327525A1At-speed test of functional memory interface logic in devicesTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 2859US7555687B2Sequential scan technique for testing integrated circuits with reduced power, time and/or costTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 30, 2009·3 cites·8 claims
- 2959US2025028476A1Methods and apparatus to characterize memoryTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 3057US2025370042A1Clock signal control for scan-chain testingTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 3150US11087857B2Enabling high at-speed test coverage of functional memory interface logic by selective usage of test pathsTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 10, 2021·0 cites·9 claims
- 3237US7380184B2Sequential scan technique providing enhanced fault coverage in an integrated circuitTEXAS INSTRUMENTS INC·Filed 2006·Granted May 27, 2008·0 cites·4 claims
- 3337US2008072112A1Sequential Scan Technique Providing Reliable Testing of an Integrated CircuitTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →