Inventor · disambiguated record
Dennis W. Wagner
Also filed as: WAGNER DENNIS W
2 granted patents·161 citations·filing 1998–2004
70Inventor score
Technology areasH01J
Files withAPPLIED MATERIALS INC2
Top patents by PatentIndex Score
2 records- 0194US6965116B1Method of determining dose uniformity of a scanning ion implanterAPPLIED MATERIALS INC·Filed 2004·Granted Nov 15, 2005·91 cites·26 claims
- 0287US6093625AApparatus for and methods of implanting desired chemical species in semiconductor substratesAPPLIED MATERIALS INC·Filed 1998·Granted Jul 25, 2000·70 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Dennis W. Wagner files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →