Inventor · disambiguated record
Dmitriy Marinskiy
Also filed as: MARINSKIY DMITRIY
6 granted patents·3 pending applications·36 citations·filing 2005–2021
75Inventor score
Files withSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD3FIRST SOLAR INC2SEMICONDUCTOR DIAGNOSTICS INC2BULLER BENYAMIN1JOHNSON BRADY A1
Top patents by PatentIndex Score
9 records- 0190US7202691B2Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafersSEMICONDUCTOR DIAGNOSTICS INC·Filed 2005·Granted Apr 10, 2007·32 cites·18 claims
- 0263US9246330B2Photovoltaic deviceBULLER BENYAMIN·Filed 2012·Granted Jan 26, 2016·2 cites·20 claims
- 0362US7405580B2Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentrationSEMICONDUCTOR DIAGNOSTICS INC·Filed 2006·Granted Jul 29, 2008·2 cites·20 claims
- 0457US2013200234A1Mounting clamp and mounting clamp configuration for photovoltaic module installationFIRST SOLAR INC·Filed 2013·Application pending·0 cites
- 0556US2013186453A1Mitigating photovoltaic module stress damage through cell isolationFIRST SOLAR INC·Filed 2012·Application pending·0 cites
- 0652US11561254B2Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substratesSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2021·Granted Jan 24, 2023·0 cites·10 claims
- 0743US10763179B2Non-contact method to monitor and quantify effective work function of metalsSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2016·Granted Sep 1, 2020·0 cites·15 claims
- 0837US8798961B2High speed spectrometerJOHNSON BRADY A·Filed 2011·Granted Aug 5, 2014·0 cites·30 claims
- 0935US2018315630A1Charge Metrology for Integrated MeasurementSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →