Inventor · disambiguated record
Dmitry Vengertsev
Also filed as: VENGERTSEV DMITRY · VENGERTSEV DMITRY A
15 granted patents·3 pending applications·35 citations·filing 2012–2025
89Inventor score
Files withMICRON TECHNOLOGY INC12GLOBALFOUNDRIES INC3META PLATFORMS INC1SAMSUNG ELECTRONICS CO LTD1VENGERTSEV DMITRY1
Top patents by PatentIndex Score
18 records- 0192US9690898B2Generative learning for realistic and ground rule clean hot spot synthesisGLOBALFOUNDRIES INC·Filed 2015·Granted Jun 27, 2017·13 cites·19 claims
- 0286US11861493B2Machine learning models based on altered data and systems and methods for training and using the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 2, 2024·2 cites·25 claims
- 0386US11585654B2Texture detection apparatuses, systems, and methods for analysisMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 21, 2023·2 cites·37 claims
- 0485US8677288B2Test pattern selection method for OPC model calibrationVENGERTSEV DMITRY·Filed 2012·Granted Mar 18, 2014·8 cites·18 claims
- 0582US11983619B2Transformer neural network in memoryMICRON TECHNOLOGY INC·Filed 2020·Granted May 14, 2024·2 cites·18 claims
- 0681US12468966B2Apparatuses and methods for color matching and recommendationsMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 11, 2025·0 cites·20 claims
- 0780US11995567B2Apparatuses and methods for color matching and recommendationsMICRON TECHNOLOGY INC·Filed 2020·Granted May 28, 2024·1 cites·27 claims
- 0878US11922613B2Apparatuses and methods for determining wafer defectsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 5, 2024·1 cites·10 claims
- 0977US2025315735A1Anomaly detection and resolutionMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1076US10042973B2Expansion of allowed design rule space by waiving benign geometriesGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 7, 2018·2 cites·19 claims
- 1170US2024289597A1Transformer neural network in memoryMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1268US9542740B2Method for detecting defect in patternSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jan 10, 2017·3 cites·11 claims
- 1368US2024185406A1Apparatuses and methods for determining wafer defectsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1462US12340282B2Anomaly detection and resolutionMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 24, 2025·0 cites·20 claims
- 1559US10146036B2Semiconductor wafer inspection using care area group-specific threshold settings for detecting defectsGLOBALFOUNDRIES INC·Filed 2016·Granted Dec 4, 2018·1 cites·20 claims
- 1658US12511560B2Methods, apparatuses and computer program products for generating synthetic dataMETA PLATFORMS INC·Filed 2022·Granted Dec 30, 2025·0 cites·14 claims
- 1754US12443834B2Binary neural network in memoryMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 14, 2025·0 cites·17 claims
- 1851US11681906B2Bayesian network in memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 20, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →