Inventor · disambiguated record
Douglas Kreszowski
Also filed as: KRESZOWSKI DOUGLAS · KRESZOWSKI DOUGLAS H · KRESZOWSKI DOUGLAS HOMER
0 granted patents·4 pending applications·0 citations·filing 2010–2016
Top patents by PatentIndex Score
4 records- 0155US2015284873A1Methods of forming and analyzing doped siliconHEMLOCK SEMICONDUCTOR CORP·Filed 2013·Application pending·0 cites
- 0251US2016320275A1Method for determining a concentration of metal impurities contaminating a silicon productHEMLOCK SEMICONDUCTOR CORP·Filed 2014·Application pending·0 cites
- 0340US2012070362A1Quantitative measurement of gas phase process intermediates using raman spectroscopyHARMS GREG·Filed 2010·Application pending·0 cites
- 0436US2017269004A1Low impurity detection method for characterizing metals within a surface and sub-surface of polycrystalline siliconHEMLOCK SEMICONDUCTOR CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →