Inventor · disambiguated record
Dov Shachal
Also filed as: SHACHAL DOV
10 granted patents·1 pending application·97 citations·filing 1999–2016
89Inventor score
Technology areasH01J
Top patents by PatentIndex Score
11 records- 0195US8164057B2Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscopeSHACHAL DOV·Filed 2007·Granted Apr 24, 2012·30 cites·69 claims
- 0290US8334510B2Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environmentSHACHAL DOV·Filed 2009·Granted Dec 18, 2012·18 cites·61 claims
- 0387US8779358B2Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscopeSHACHAL DOV·Filed 2012·Granted Jul 15, 2014·6 cites·7 claims
- 0486US8492716B2Vacuumed device and a scanning electron microscopeSHACHAL DOV·Filed 2009·Granted Jul 23, 2013·10 cites·45 claims
- 0580US8981294B2Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environmentNANO LTD B·Filed 2012·Granted Mar 17, 2015·6 cites·12 claims
- 0677US9076631B2Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscopeSHACHAL DOV·Filed 2014·Granted Jul 7, 2015·2 cites·19 claims
- 0773US6627886B1Secondary electron spectroscopy method and systemAPPLIED MATERIALS INC·Filed 1999·Granted Sep 30, 2003·24 cites·11 claims
- 0862US9431213B2Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environmentB-NANO LTD·Filed 2015·Granted Aug 30, 2016·1 cites·6 claims
- 0955US9287089B2Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscopeSHACHAL DOV·Filed 2015·Granted Mar 15, 2016·0 cites·16 claims
- 1052US2016155606A1Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscopeNANO LTD B·Filed 2016·Application pending·0 cites
- 1148US9466458B2Scanning electron microscopeB-NANO LTD·Filed 2014·Granted Oct 11, 2016·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →