Inventor · disambiguated record
Dror Alumot
Also filed as: ALUMOT DROR
7 granted patents·3 pending applications·21 citations·filing 2016–2024
77Inventor score
Top patents by PatentIndex Score
10 records- 0194US11022566B1Examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 1, 2021·13 cites·29 claims
- 0287US10571811B2Device metrology targets and methodsKLA TENCOR CORP·Filed 2016·Granted Feb 25, 2020·5 cites·25 claims
- 0385US10409171B2Overlay control with non-zero offset predictionKLA TENCOR CORP·Filed 2018·Granted Sep 10, 2019·3 cites·39 claims
- 0459US2025264814A1Optimization of a metrology algorithm for examination of semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0557US11862522B2Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2021·Granted Jan 2, 2024·0 cites·9 claims
- 0653US11054752B2Device metrology targets and methodsKLA TENCOR CORP·Filed 2018·Granted Jul 6, 2021·0 cites·23 claims
- 0748US12511720B2Image denoising for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Dec 30, 2025·0 cites·20 claims
- 0846US2025045904A1Image segmentation for examining a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0943US2018047646A1Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2017·Application pending·0 cites
- 1041US12423798B2Shape localization for examining a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 23, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →