Inventor · disambiguated record
Dror Shafir
Also filed as: SHAFIR DROR
17 granted patents·5 pending applications·18 citations·filing 2013–2024
90Inventor score
Top patents by PatentIndex Score
22 records- 0189US10161885B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2015·Granted Dec 25, 2018·5 cites·19 claims
- 0288US12467879B2Optical phase measurement method and systemNOVA LTD·Filed 2024·Granted Nov 11, 2025·0 cites·16 claims
- 0388US11029258B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jun 8, 2021·2 cites·20 claims
- 0486US10876959B2Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2018·Granted Dec 29, 2020·2 cites·3 claims
- 0584US11885737B2Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2020·Granted Jan 30, 2024·1 cites·8 claims
- 0684US2024337590A1Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2024·Application pending·0 cites
- 0783US11946875B2Optical phase measurement system and methodNOVA LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 0881US10365231B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 0980US10739277B2Optical system and method for measurements of samplesNOVA MEASURING INSTR LTD·Filed 2016·Granted Aug 11, 2020·2 cites·21 claims
- 1075US10073045B2Optical method and system for measuring isolated features of a structureNOVA MEASURING INSTR LTD·Filed 2013·Granted Sep 11, 2018·2 cites·29 claims
- 1175US9897553B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 20, 2018·1 cites·20 claims
- 1274US2021364451A1Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2021·Application pending·0 cites
- 1369US11460415B2Optical phase measurement system and methodNOVA LTD·Filed 2020·Granted Oct 4, 2022·0 cites·18 claims
- 1468US10054423B2Optical method and system for critical dimensions and thickness characterizationNOVA MEASURING INSTR LTD·Filed 2013·Granted Aug 21, 2018·2 cites·15 claims
- 1565US10663408B2Optical phase measurement system and methodNOVA MEASURING INSTR LTD·Filed 2019·Granted May 26, 2020·0 cites·20 claims
- 1663US2015316468A1Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2014·Application pending·0 cites
- 1759US10365163B2Optical critical dimension metrologyNOVA MEASURING INSTR LTD·Filed 2018·Granted Jul 30, 2019·0 cites·20 claims
- 1859US2022390858A1Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2022·Application pending·0 cites
- 1952US11366398B2Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2019·Granted Jun 21, 2022·0 cites·16 claims
- 2052US10041838B2Optical critical dimension metrologyNOVA MEASURING INSTR LTD·Filed 2015·Granted Aug 7, 2018·0 cites·11 claims
- 2148US2024271926A1Metrology technique for semiconductor devicesNOVA LTD·Filed 2022·Application pending·0 cites
- 2232US10311198B2Overlay design optimizationNOVA MEASURING INSTR LTD·Filed 2015·Granted Jun 4, 2019·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →