Inventor · disambiguated record
Duane B. Barber
Also filed as: BARBER DUANE B
11 granted patents·2 pending applications·60 citations·filing 1997–2012
88Inventor score
Top patents by PatentIndex Score
13 records- 0186US9029215B2Method of making an insulated gate semiconductor device having a shield electrode structureHOSSAIN ZIA·Filed 2012·Granted May 12, 2015·8 cites·20 claims
- 0280US7897462B2Method of manufacturing semiconductor component with gate and shield electrodes in trenchesSEMICONDUCTOR COMPONENTS IND·Filed 2008·Granted Mar 1, 2011·7 cites·15 claims
- 0364US6818365B2Feed forward levelingLSI LOGIC CORP·Filed 2002·Granted Nov 16, 2004·8 cites·20 claims
- 0463US6861183B2Scatter dotsLSI LOGIC CORP·Filed 2002·Granted Mar 1, 2005·7 cites·20 claims
- 0560US8685822B2Semiconductor component and method of manufactureBURKE PETER A·Filed 2011·Granted Apr 1, 2014·1 cites·20 claims
- 0655US7638245B2Mask set for variable mask field exposureLSI CORP·Filed 2008·Granted Dec 29, 2009·0 cites·5 claims
- 0755US5825105AMagnetic levitation and systems for the support and conveyance of useful payloadsMODERN TRANSPORT SYSTEMS CORP·Filed 1997·Granted Oct 20, 1998·22 cites·35 claims
- 0850US7550236B2Multi wavelength mask for multi layer printing on a process substrateLSI CORP·Filed 2004·Granted Jun 23, 2009·3 cites·9 claims
- 0949US7018753B2Variable mask field exposureLSI LOGIC CORP·Filed 2003·Granted Mar 28, 2006·2 cites·3 claims
- 1048US2006093965A1Variable mask field exposureLSI LOGIC CORP·Filed 2005·Application pending·0 cites
- 1144US7016054B2Lithography line width monitor reflecting chip-wide average feature sizeLSI LOGIC CORP·Filed 2003·Granted Mar 21, 2006·1 cites·13 claims
- 1242US2010123193A1Semiconductor component and method of manufactureBURKE PETER A·Filed 2008·Application pending·0 cites
- 1338US8685633B2Method for optimizing wafer edge patterningBARBER DUANE B·Filed 2004·Granted Apr 1, 2014·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →