Inventor · disambiguated record
Edward L. Malantonio
Also filed as: MALANTONIO EDWARD L · MALANTONIO EDWARD LAMBERT
8 granted patents·3 pending applications·103 citations·filing 2005–2011
87Inventor score
Top patents by PatentIndex Score
11 records- 0192US7638028B2Probe tip platingSV PROBE PTE LTD·Filed 2005·Granted Dec 29, 2009·16 cites·16 claims
- 0287US7583098B2Automated probe card planarization and alignment methods and toolsSV PROBE PTE LTD·Filed 2007·Granted Sep 1, 2009·19 cites·11 claims
- 0386US7462800B2Method of shaping lithographically-produced probe elementsSV PROBE PTE LTD·Filed 2005·Granted Dec 9, 2008·16 cites·9 claims
- 0485US7721430B2Approach for fabricating cantilever probesSV PROBE PTE LTD·Filed 2007·Granted May 25, 2010·18 cites·20 claims
- 0585US7437813B2Probe repair methodsSV PROBE PTE LTD·Filed 2007·Granted Oct 21, 2008·21 cites·10 claims
- 0676US8004299B2Cantilever probe structure for a probe card assemblySV PROBE PTE LTD·Filed 2011·Granted Aug 23, 2011·3 cites·10 claims
- 0771US7393773B2Method and apparatus for producing co-planar bonding pads on a substrateSV PROBE PTE LTD·Filed 2005·Granted Jul 1, 2008·7 cites·18 claims
- 0865US7808260B2Probes for a wafer test apparatusSV PROBE PTE LTD·Filed 2006·Granted Oct 5, 2010·3 cites·22 claims
- 0941US2007089551A1Cantilever probe structure for a probe card assemblySV PROBE PTD LTD·Filed 2006·Application pending·0 cites
- 1035US2006028220A1Reinforced probes for testing semiconductor devicesK & S INTERCONNECT INC·Filed 2005·Application pending·0 cites
- 1134US2007200576A1Multi-layered probesLAURENT EDWARD T·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →