Inventor · disambiguated record
Ehrenfried Zschech
Also filed as: ZSCHECH EHRENFRIED
12 granted patents·133 citations·filing 2001–2018
90Inventor score
Files withADVANCED MICRO DEVICES INC6FRAUNHOFER GES FORSCHUNG3GLOBALFOUNDRIES INC1HECKER MICHAEL1SEIFERT GOTTHART1
Top patents by PatentIndex Score
12 records- 0195US10153062B2Illumination and imaging device for high-resolution X-ray microscopy with high photon energyFRAUNHOFER GES FORSCHUNG·Filed 2016·Granted Dec 11, 2018·33 cites·12 claims
- 0283US6303399B1Method of sample preparation for electron microscopyADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 16, 2001·42 cites·23 claims
- 0380US8056402B2Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniquesHECKER MICHAEL·Filed 2008·Granted Nov 15, 2011·14 cites·8 claims
- 0478US11243151B2Device for carrying out bending tests on panel-shaped or beam shaped samplesFRAUNHOFER GES FORSCHUNG·Filed 2018·Granted Feb 8, 2022·2 cites·13 claims
- 0569US7311008B2Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structureADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 25, 2007·3 cites·17 claims
- 0666US6894390B2Soft error resistant semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted May 17, 2005·17 cites·21 claims
- 0765US6953755B2Technique for monitoring the state of metal lines in microstructuresADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 11, 2005·6 cites·47 claims
- 0859US9117771B2Insulation material for integrated circuits and use of said integrated circuitsSEIFERT GOTTHART·Filed 2010·Granted Aug 25, 2015·3 cites·16 claims
- 0954US7183629B2Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal lineADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 27, 2007·8 cites·12 claims
- 1049US8039395B2Technique for forming embedded metal lines having increased resistance against stress-induced material transportGLOBALFOUNDRIES INC·Filed 2004·Granted Oct 18, 2011·5 cites·27 claims
- 1146US10151645B2Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materialsFRAUNHOFER GES FORSCHUNG·Filed 2014·Granted Dec 11, 2018·0 cites·12 claims
- 1245US7441446B2Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizingADVANCED MICRO DEVICES INC·Filed 2006·Granted Oct 28, 2008·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →