Inventor · disambiguated record
Eiichi Sekine
Also filed as: SEKINE EIICHI
3 granted patents·127 citations·filing 1988–1999
76Inventor score
Top patents by PatentIndex Score
3 records- 0173US6417682B1Semiconductor device testing apparatus and its calibration methodADVANTEST CORP·Filed 1999·Granted Jul 9, 2002·46 cites·42 claims
- 0273US4878743AAutomotive mirror using electrochromic elementICHIKOH INDUSTRIES LTD·Filed 1988·Granted Nov 7, 1989·47 cites·3 claims
- 0366US5862088AApparatus and method for testing a memoryADVANTEST CORP·Filed 1998·Granted Jan 19, 1999·34 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →