Inventor · disambiguated record
Elfido Coss, Jr.
Also filed as: COSS ELFIDO · COSS JR ELFIDO
66 granted patents·1,864 citations·filing 1996–2007
99Inventor score
Files withADVANCED MICRO DEVICES INC58GLOBALFOUNDRIES INC3ADVANCE MICRO DEVICES INC2CONBOY MICHAEL R1COSS JR ELFIDO1
Top patents by PatentIndex Score
66 records- 0197US6304999B1Method and apparatus for embedded process control framework in tool systemsADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 16, 2001·149 cites·23 claims
- 0295US6594589B1Method and apparatus for monitoring tool healthADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 15, 2003·77 cites·51 claims
- 0393US6465263B1Method and apparatus for implementing corrected species by monitoring specific state parametersADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 15, 2002·69 cites·17 claims
- 0492US6725402B1Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) frameworkADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 20, 2004·78 cites·17 claims
- 0591US6532555B1Method and apparatus for integration of real-time tool data and in-line metrology for fault detection in an advanced process control (APC) frameworkADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 11, 2003·78 cites·21 claims
- 0690US7200779B1Fault notification based on a severity levelADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 3, 2007·69 cites·1 claims
- 0790US6831555B1Method and apparatus for dynamically monitoring system components in an advanced process control (APC) frameworkADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 14, 2004·58 cites·19 claims
- 0890US6431814B1Integrated wafer stocker and sorter with integrity verification systemADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 13, 2002·56 cites·15 claims
- 0989US6778873B1Identifying a cause of a fault based on a process controller outputADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·56 cites·27 claims
- 1088US6546508B1Method and apparatus for fault detection of a processing tool in an advanced process control (APC) frameworkADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 8, 2003·61 cites·23 claims
- 1187US8321048B1Associating data with workpieces and correlating the data with yield dataCOSS JR ELFIDO·Filed 2002·Granted Nov 27, 2012·40 cites·21 claims
- 1287US6954883B1Method and apparatus for performing fault detection using data from a databaseADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 11, 2005·42 cites·29 claims
- 1383US6871112B1Method for requesting trace data reports from FDC semiconductor fabrication processesADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 22, 2005·32 cites·36 claims
- 1482US6740534B1Determination of a process flow based upon fault detection analysisADVANCED MICRO DEVICES INC·Filed 2002·Granted May 25, 2004·34 cites·16 claims
- 1582US6356804B1Automated material handling system method and arrangementADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 12, 2002·42 cites·7 claims
- 1682US6157866AAutomated material handling system for a manufacturing facility divided into separate fabrication areasADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 5, 2000·60 cites·43 claims
- 1779US6871114B1Updating process controller based upon fault detection analysisFiled 2002·Granted Mar 22, 2005·25 cites·37 claims
- 1879US6457587B1Integrated reticle sorter and stockerADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 1, 2002·20 cites·20 claims
- 1979US6411859B1Flow control in a semiconductor fabrication facilityADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 25, 2002·53 cites·35 claims
- 2079US6308107B1Realtime decision making system for reduction of time delays in an automated material handling systemADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 23, 2001·56 cites·11 claims
- 2178US6834213B1Process control based upon a metrology delayADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 21, 2004·25 cites·29 claims
- 2278US6711450B1Integration of business rule parameters in priority setting of wafer processingADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 23, 2004·21 cites·20 claims
- 2378US6625556B1Wafer rotation randomization for process defect detection in semiconductor fabricationADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 23, 2003·20 cites·32 claims
- 2477US6571371B1Method and apparatus for using latency time as a run-to-run control parameterADVANCED MICRO DEVICES INC·Filed 2000·Granted May 27, 2003·21 cites·30 claims
- 2576US7051250B1Routing workpieces based upon detecting a faultADVANCED MICRO DEVICES INC·Filed 2002·Granted May 23, 2006·19 cites·22 claims
- 2675US7031793B1Conflict resolution among multiple controllersADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 18, 2006·20 cites·24 claims
- 2775US6640148B1Method and apparatus for scheduled controller execution based upon impending lot arrival at a processing tool in an APC frameworkADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 28, 2003·19 cites·21 claims
- 2874US7321993B1Method and apparatus for fault detection classification of multiple tools based upon external dataADVANCED MICRO DEVICES INC·Filed 2004·Granted Jan 22, 2008·17 cites·55 claims
- 2974US6905895B1Predicting process excursions based upon tool state variablesADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 14, 2005·25 cites·38 claims
- 3073US7130769B1Method of dynamically designing a preventative maintenance schedule based upon sensor data, and system for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 31, 2006·16 cites·28 claims
- 3173US7039495B1Management of multiple types of empty carriers in automated material handling systemsADVANCE MICRO DEVICES INC·Filed 1998·Granted May 2, 2006·43 cites·20 claims
- 3273US6960774B2Fault detection and control methodologies for ion implantation processes, and system for performing sameADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 1, 2005·10 cites·45 claims
- 3373US6697696B1Fault detection control system using dual bus architecture, and methods of using sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 24, 2004·11 cites·28 claims
- 3473US6035245AAutomated material handling system method and arrangementADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 7, 2000·37 cites·17 claims
- 3572US7783455B1Methods and systems for analyzing process equipment processing variations using sensor dataGLOBALFOUNDRIES INC·Filed 2005·Granted Aug 24, 2010·6 cites·23 claims
- 3672US6440821B1Method and apparatus for aligning wafersADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 27, 2002·14 cites·25 claims
- 3771US6834211B1Adjusting a trace data rate based upon a tool stateADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 21, 2004·15 cites·32 claims
- 3871US6790680B1Determining a possible cause of a fault in a semiconductor fabrication processADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 14, 2004·13 cites·37 claims
- 3971US6666337B1Method and apparatus for determining wafer identity and orientationADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 23, 2003·16 cites·21 claims
- 4071US5924833AAutomated wafer transfer systemADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 20, 1999·41 cites·12 claims
- 4171US5904487AElectrode reshaping in a semiconductor etching deviceADVANCED MICRO DEVICES INC·Filed 1996·Granted May 18, 1999·37 cites·25 claims
- 4270US6403905B1Reticle stocking and sorting management systemADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 11, 2002·11 cites·25 claims
- 4369US6868512B1Fault detection system with real-time databaseADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 15, 2005·11 cites·27 claims
- 4469US6392403B1Integrated wafer stocker and sorter apparatusADVANCED MICRO DEVICES INC·Filed 2000·Granted May 21, 2002·13 cites·25 claims
- 4566US6763278B1Operating a processing tool in a degraded mode upon detecting a faultADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 13, 2004·10 cites·30 claims
- 4665US6449522B1Managing a semiconductor fabrication facility using wafer lot and cassette attributesADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 10, 2002·28 cites·33 claims
- 4764US6850322B2Method and apparatus for controlling wafer thickness uniformity in a multi-zone vertical furnaceADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 1, 2005·9 cites·18 claims
- 4859US6778876B1Methods of processing substrates based upon substrate orientationADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·7 cites·50 claims
- 4959US6662070B1Wafer rotation randomization in cluster tool processingADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 9, 2003·6 cites·29 claims
- 5058US6446022B1Wafer fabrication system providing measurement data screeningADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 3, 2002·24 cites·19 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →