Inventor · disambiguated record
Emanuel Elyasaf
Also filed as: ELYASAF EMANUEL
19 granted patents·2 pending applications·718 citations·filing 1997–2024
95Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD10APPLIED MATERIALS INC7BEN-HAIM SHLOMO1INZIV LTD1ORBOT INSTR LTD1
Top patents by PatentIndex Score
21 records- 0197US6268093B1Method for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 1999·Granted Jul 31, 2001·205 cites·32 claims
- 0295US7619203B2High throughput multi beam detection system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Nov 17, 2009·28 cites·21 claims
- 0395US6175645B1Optical inspection method and apparatusAPPLIED MATERIALS INC·Filed 1998·Granted Jan 16, 2001·175 cites·55 claims
- 0494US7504622B2High throughput multi beam detection system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Mar 17, 2009·34 cites·20 claims
- 0594US7133548B2Method and apparatus for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 2001·Granted Nov 7, 2006·53 cites·31 claims
- 0690US5892579AOptical inspection method and apparatusORBOT INSTR LTD·Filed 1997·Granted Apr 6, 1999·109 cites·32 claims
- 0787US6798505B2Method and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2003·Granted Sep 28, 2004·20 cites·5 claims
- 0885US7187439B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Mar 6, 2007·11 cites·18 claims
- 0983US6809808B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2002·Granted Oct 26, 2004·23 cites·25 claims
- 1077US7355690B2Double inspection of reticle or waferAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Apr 8, 2008·22 cites·23 claims
- 1172US6930770B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Aug 16, 2005·9 cites·17 claims
- 1271US6853475B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted Feb 8, 2005·11 cites·9 claims
- 1369US7053395B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted May 30, 2006·10 cites·7 claims
- 1466US9699835B2Machine readable element and optical indicium for authenticating an item before processingYOGEV ITZHAK·Filed 2011·Granted Jul 4, 2017·4 cites·17 claims
- 1559US7601944B2High throughput multi beam detection system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Oct 13, 2009·0 cites·1 claims
- 1659US7400390B2Inspection system and a method for aerial reticle inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Jul 15, 2008·3 cites·10 claims
- 1758US2025123320A1Approaches and probes for excitation, detection, and sensing of devices under testINZIV LTD·Filed 2024·Application pending·0 cites
- 1856US7841529B2Multiple optical head inspection system and a method for imaging an articleAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Nov 30, 2010·1 cites·17 claims
- 1954US7326901B2High throughput multi beam system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Feb 5, 2008·0 cites·2 claims
- 2053US7518718B2High throughput inspection system and a method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 14, 2009·0 cites·12 claims
- 2144US2015300226A1Em energy application for treating exhaust gasesBEN-HAIM SHLOMO·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →