Inventor · disambiguated record
Emine Korkmaz
Also filed as: KORKMAZ EMINE
2 granted patents·1 pending application·0 citations·filing 2016–2019
26Inventor score
Files withFEI CO3
Top patents by PatentIndex Score
3 records- 0156US10811223B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2018·Granted Oct 20, 2020·0 cites·17 claims
- 0248US10115561B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2016·Granted Oct 30, 2018·0 cites·20 claims
- 0339US2020111219A1Object tracking using image segmentationFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →