Inventor · disambiguated record
Enden David Liu
Also filed as: LIU ENDEN DAVID
2 granted patents·43 citations·filing 2013–2015
64Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0193US9620332B1Charged particle beam substrate inspection using both vector and raster scanningMULTIBEAM CORP·Filed 2015·Granted Apr 11, 2017·14 cites·8 claims
- 0292US9466463B1Charged particle beam substrate inspection using both vector and raster scanningMUTIBEAM CORP·Filed 2013·Granted Oct 11, 2016·29 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →