Inventor · disambiguated record
Erwan Le Roy
Also filed as: LE ROY ERWAN
8 granted patents·1 pending application·72 citations·filing 2002–2007
85Inventor score
Top patents by PatentIndex Score
9 records- 0182US7135123B1Method and system for integrated circuit backside navigationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 14, 2006·30 cites·21 claims
- 0282US7115426B2Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrateCREDENCE SYSTEMS CORP·Filed 2005·Granted Oct 3, 2006·9 cites·19 claims
- 0373US7884024B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2007·Granted Feb 8, 2011·4 cites·20 claims
- 0472US7488937B2Method and apparatus for the improvement of material/voltage contrastCREDENCE SYSTEMS CORP·Filed 2005·Granted Feb 10, 2009·3 cites·25 claims
- 0572US6955930B2Method for determining thickness of a semiconductor substrate at the floor of a trenchCREDENCE SYSTEMS CORP·Filed 2002·Granted Oct 18, 2005·14 cites·6 claims
- 0664US6855622B2Method and apparatus for forming a cavity in a semiconductor substrate using a charged particle beamNPTEST LLC·Filed 2002·Granted Feb 15, 2005·10 cites·18 claims
- 0752US7036109B1Imaging integrated circuits with focused ion beamCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·2 cites·29 claims
- 0846US2007087572A1Method and apparatus for the improvement of material/voltage contrastLE ROY ERWAN·Filed 2006·Application pending·0 cites
- 0945US7697146B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2006·Granted Apr 13, 2010·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →