Inventor · disambiguated record
Ernest Y. Wu
Also filed as: WU ERNEST · WU ERNEST Y
26 granted patents·5 pending applications·140 citations·filing 2001–2022
94Inventor score
Top patents by PatentIndex Score
31 records- 0192US11257750B2E-fuse co-processed with MIM capacitorIBM·Filed 2020·Granted Feb 22, 2022·3 cites·20 claims
- 0292US10229873B2Three plate MIM capacitor via integrity verificationIBM·Filed 2017·Granted Mar 12, 2019·4 cites·20 claims
- 0389US6750530B1Semiconductor antifuse with heating elementIBM·Filed 2003·Granted Jun 15, 2004·57 cites·20 claims
- 0488US10989754B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Apr 27, 2021·2 cites·13 claims
- 0588US10564214B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Feb 18, 2020·2 cites·12 claims
- 0687US9739824B2Optimization of integrated circuit reliabilityIBM·Filed 2016·Granted Aug 22, 2017·2 cites·10 claims
- 0783US7298161B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2005·Granted Nov 20, 2007·10 cites·7 claims
- 0883US7011547B1Connector of coaxial cablesGOLDEN LOCH IND CO LTD·Filed 2004·Granted Mar 14, 2006·41 cites·2 claims
- 0980US9287185B1Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variationsIBM·Filed 2015·Granted Mar 15, 2016·3 cites·20 claims
- 1080US8839180B1Dielectric reliability assessment for advanced semiconductorsIBM·Filed 2013·Granted Sep 16, 2014·4 cites·15 claims
- 1177US11489118B2Reliable resistive random access memoryIBM·Filed 2019·Granted Nov 1, 2022·2 cites·15 claims
- 1277US9026981B2Dielectric reliability assessment for advanced semiconductorsIBM·Filed 2014·Granted May 5, 2015·3 cites·9 claims
- 1377US8352900B1Analytic experimental estimator for impact of voltage-overshoot of voltage waveform on dielectric failure/breakdownIBM·Filed 2012·Granted Jan 8, 2013·5 cites·24 claims
- 1472US10996259B2Optimization of integrated circuit reliabilityIBM·Filed 2020·Granted May 4, 2021·0 cites·17 claims
- 1571US11054459B2Optimization of integrated circuit reliabilityIBM·Filed 2019·Granted Jul 6, 2021·0 cites·15 claims
- 1668US10811353B2Sub-ground rule e-Fuse structureIBM·Filed 2018·Granted Oct 20, 2020·1 cites·19 claims
- 1762US10262934B2Three plate MIM capacitor via integrity verificationIBM·Filed 2017·Granted Apr 16, 2019·0 cites·20 claims
- 1857US9310418B2Correction for stress induced leakage current in dielectric reliability evaluationsIBM·Filed 2014·Granted Apr 12, 2016·0 cites·22 claims
- 1956US9395403B2Optimization of integrated circuit reliabilityIBM·Filed 2013·Granted Jul 19, 2016·0 cites·20 claims
- 2054US11901002B2RRAM filament spatial localization using a laser stimulationIBM·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 2153US10651083B2Graded interconnect capIBM·Filed 2018·Granted May 12, 2020·0 cites·7 claims
- 2251US2023420491A1Ferroelectric Film with Buffer Layers for Improved Reliability of Metal-Insulator-Metal CapacitorIBM·Filed 2022·Application pending·0 cites
- 2347US10804368B2Semiconductor device having two-part spacerIBM·Filed 2018·Granted Oct 13, 2020·0 cites·20 claims
- 2446US10770393B2BEOL thin film resistorIBM·Filed 2018·Granted Sep 8, 2020·0 cites·17 claims
- 2545US11121082B2Sub-ground rule e-Fuse structureIBM·Filed 2019·Granted Sep 14, 2021·0 cites·11 claims
- 2645US2009006014A1Non-Destructive Electrical Characterization Macro and Methodology for In-Line Interconnect Spacing MonitoringIBM·Filed 2007·Application pending·0 cites
- 2742US6891359B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2003·Granted May 10, 2005·1 cites·11 claims
- 2841US10103060B2Test structures for dielectric reliability evaluationsGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 16, 2018·0 cites·20 claims
- 2940US2014195175A1Measuring dielectric breakdown in a dynamic modeIBM·Filed 2013·Application pending·0 cites
- 3033US2002027681A1Gate stack process for high reliability dual oxide CMOS devices and circuitsIBM·Filed 2001·Application pending·0 cites
- 3133US2012187974A1Dual Stage Voltage Ramp Stress Test for Gate DielectricsBROCHU JR DAVID G·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →