Inventor · disambiguated record
Faysal Boughorbel
Also filed as: BOUGHORBEL FAYSAL
17 granted patents·3 pending applications·140 citations·filing 2007–2020
92Inventor score
Top patents by PatentIndex Score
20 records- 0195US8232523B2SEM imaging methodBOUGHORBEL FAYSAL·Filed 2011·Granted Jul 31, 2012·41 cites·20 claims
- 0294US8581189B2Charged particle microscopy imaging methodBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 12, 2013·18 cites·20 claims
- 0393US9620330B2Mathematical image assembly in a scanning-type microscopeFEI CO·Filed 2015·Granted Apr 11, 2017·15 cites·20 claims
- 0493US9312098B2Method of examining a sample in a charged-particle microscopeFEI CO·Filed 2015·Granted Apr 12, 2016·16 cites·20 claims
- 0593US8586921B2Charged-particle microscope providing depth-resolved imageryBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 19, 2013·19 cites·17 claims
- 0689US8704176B2Charged particle microscope providing depth-resolved imageryFEI CO·Filed 2013·Granted Apr 22, 2014·12 cites·20 claims
- 0785US9478393B2Computational scanning microscopy with improved resolutionFEI CO·Filed 2015·Granted Oct 25, 2016·6 cites·14 claims
- 0883US10545100B2X-ray imaging techniqueFEI CO·Filed 2016·Granted Jan 28, 2020·3 cites·19 claims
- 0982US9934936B2Charged particle microscope with special aperture plateFEI CO·Filed 2015·Granted Apr 3, 2018·4 cites·20 claims
- 1074US8698078B2Charged-particle microscopy with occlusion detectionPHIFER JR DANIEL WOODROW·Filed 2012·Granted Apr 15, 2014·5 cites·11 claims
- 1169US9711325B2Charged-particle microscope providing depth-resolved imageryFEI CO·Filed 2014·Granted Jul 18, 2017·1 cites·22 claims
- 1262US11482400B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2020·Granted Oct 25, 2022·0 cites·10 claims
- 1356US10811223B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2018·Granted Oct 20, 2020·0 cites·17 claims
- 1455US10903043B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2018·Granted Jan 26, 2021·0 cites·12 claims
- 1548US10115561B2Method of analyzing surface modification of a specimen in a charged-particle microscopeFEI CO·Filed 2016·Granted Oct 30, 2018·0 cites·20 claims
- 1645US8340399B2Method for determining a depth map from images, device for determining a depth mapBOUGHORBEL FAYSAL·Filed 2007·Granted Dec 25, 2012·0 cites·11 claims
- 1741US2009316994A1Method and filter for recovery of disparities in a video streamBOUGHORBEL FAYSAL·Filed 2007·Application pending·0 cites
- 1841US2020312611A1Artificial intelligence enabled volume reconstructionFEI CO·Filed 2019·Application pending·0 cites
- 1934US10128080B2Three-dimensional imaging in charged-particle microscopyFEI CO·Filed 2017·Granted Nov 13, 2018·0 cites·20 claims
- 2032US2015279615A1Imaging a Sample with Multiple Beams and Multiple DetectorsFEI CO·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →