Inventor · disambiguated record
Farzad Farhadzadeh
Also filed as: FARHADZADEH FARZAD
3 granted patents·2 pending applications·0 citations·filing 2018–2024
42Inventor score
Top patents by PatentIndex Score
5 records- 0175US2024412067A1Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A SubstrateASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0254US12112260B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2019·Granted Oct 8, 2024·0 cites·19 claims
- 0354US10794693B2Metrology method, apparatus and computer programASML NETHERLANDS BV·Filed 2018·Granted Oct 6, 2020·0 cites·12 claims
- 0454US2025272783A1Graphics texture reconstructionQUALCOMM INC·Filed 2024·Application pending·0 cites
- 0549US10451978B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2018·Granted Oct 22, 2019·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →