Inventor · disambiguated record
Fang Hong Gn
Also filed as: GN FANG HONG
5 granted patents·2 pending applications·140 citations·filing 1996–2013
82Inventor score
Files withCHARTERED SEMICONDUCTOR MFG2LIM VICTOR SENG KEONG2GLOBALFOUNDRIES INC1LEE HUN CHOW1LIM BARBARA FONG CHIN1
Top patents by PatentIndex Score
7 records- 0190US8339449B2Defect monitoring in semiconductor device fabricationLIM BARBARA FONG CHIN·Filed 2009·Granted Dec 25, 2012·84 cites·20 claims
- 0285US8289508B2Defect detection recipe definitionLIM VICTOR SENG KEONG·Filed 2009·Granted Oct 16, 2012·16 cites·19 claims
- 0363US8178368B2Test chiplets for devicesLIM VICTOR SENG KEONG·Filed 2009·Granted May 15, 2012·2 cites·20 claims
- 0463US6586143B1Accurate wafer patterning method for mass productionCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jul 1, 2003·11 cites·18 claims
- 0560US5677238ASemiconductor contact metallizationCHARTERED SEMICONDUCTOR MFG·Filed 1996·Granted Oct 14, 1997·27 cites·12 claims
- 0642US2015006138A1Optical proximity correction for connecting via between layers of a deviceGLOBALFOUNDRIES INC·Filed 2013·Application pending·0 cites
- 0738US2013252350A1System and method for generating care areas for defect inspectionLEE HUN CHOW·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →