Inventor · disambiguated record
Fernando Guarin
Also filed as: GUARIN FERNANDO · GUARIN FERNANDO J · GUARIN FERNANDO JOSE
10 granted patents·445 citations·filing 1995–2017
92Inventor score
Top patents by PatentIndex Score
10 records- 0194US10126354B1Assessment of HCI in logic circuits based on AC stress in discrete FETsGLOBALFOUNDRIES INC·Filed 2017·Granted Nov 13, 2018·15 cites·20 claims
- 0294US6476632B1Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoringIBM·Filed 2000·Granted Nov 5, 2002·153 cites·13 claims
- 0390US6521469B1Line monitoring of negative bias temperature instabilities by hole injection methodsIBM·Filed 2000·Granted Feb 18, 2003·63 cites·20 claims
- 0490US5667586AMethod for forming a single crystal semiconductor on a substrateIBM·Filed 1996·Granted Sep 16, 1997·78 cites·11 claims
- 0589US7723824B2Methodology for recovery of hot carrier induced degradation in bipolar devicesIBM·Filed 2007·Granted May 25, 2010·16 cites·15 claims
- 0681US6456104B1Method and structure for in-line monitoring of negative bias temperature instability in field effect transistorsIBM·Filed 1999·Granted Sep 24, 2002·53 cites·19 claims
- 0780US8159814B2Method of operating transistors and structures thereof for improved reliability and lifetimeWANG PING-CHUAN·Filed 2009·Granted Apr 17, 2012·10 cites·27 claims
- 0879US5563428ALayered structure of a substrate, a dielectric layer and a single crystal layerFiled 1995·Granted Oct 8, 1996·40 cites·13 claims
- 0965US7238565B2Methodology for recovery of hot carrier induced degradation in bipolar devicesIBM·Filed 2004·Granted Jul 3, 2007·10 cites·11 claims
- 1053US6958621B2Method and circuit for element wearout recoveryIBM·Filed 2003·Granted Oct 25, 2005·7 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Fernando Guarin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →