Inventor · disambiguated record
Feiyang Wu
Also filed as: WU FEIYANG
6 granted patents·14 citations·filing 2008–2013
77Inventor score
Top patents by PatentIndex Score
6 records- 0178US8519724B2Electrode for use in measuring dielectric properties of partsKIM JAEHYUN·Filed 2008·Granted Aug 27, 2013·7 cites·19 claims
- 0277US7973539B1Methods for measuring dielectric properties of partsLAM RES CORP·Filed 2011·Granted Jul 5, 2011·3 cites·17 claims
- 0362US9322795B2Electrode for use in measuring dielectric properties of partsLAM RES CORP·Filed 2013·Granted Apr 26, 2016·0 cites·16 claims
- 0462US8269510B2Apparatus for measuring dielectric properties of partsKIM JAEHYUN·Filed 2008·Granted Sep 18, 2012·2 cites·20 claims
- 0561US7777500B2Methods for characterizing dielectric properties of partsLAM RES CORP·Filed 2008·Granted Aug 17, 2010·2 cites·10 claims
- 0646US7911213B2Methods for measuring dielectric properties of partsLAM RES CORP·Filed 2008·Granted Mar 22, 2011·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →