Inventor · disambiguated record
Frank Huebinger
Also filed as: HUEBINGER FRANK
11 granted patents·2 pending applications·57 citations·filing 2005–2016
87Inventor score
Top patents by PatentIndex Score
13 records- 0187US7651942B2Metal interconnect structure and methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 26, 2010·17 cites·36 claims
- 0285US7723818B2Semiconductor devices and methods of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2007·Granted May 25, 2010·12 cites·19 claims
- 0382US7687862B2Semiconductor devices with active regions of different heightsINFINEON TECHNOLOGIES AG·Filed 2008·Granted Mar 30, 2010·10 cites·12 claims
- 0480US7619310B2Semiconductor interconnect and method of making sameINFINEON TECHNOLOGIES AG·Filed 2006·Granted Nov 17, 2009·10 cites·19 claims
- 0576US8003458B2Methods of manufacturing a semiconductor device with active regions of different heightsINFINEON TECHNOLOGIES AG·Filed 2010·Granted Aug 23, 2011·4 cites·29 claims
- 0670US9437593B2Silicided semiconductor structure and method of forming the sameINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 6, 2016·2 cites·19 claims
- 0763US8501576B2Dummy structures and methodsHUEBINGER FRANK·Filed 2011·Granted Aug 6, 2013·2 cites·23 claims
- 0851US9000597B2Dummy structures and methodsINFINEON TECHNOLOGIES AG·Filed 2013·Granted Apr 7, 2015·0 cites·16 claims
- 0951US8865592B2Silicided semiconductor structure and method of forming the sameYAN JIANG·Filed 2009·Granted Oct 21, 2014·0 cites·4 claims
- 1046US7883987B2Semiconductor devices and methods of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2010·Granted Feb 8, 2011·0 cites·20 claims
- 1144US9263384B2Programmable devices and methods of manufacture thereofHUEBINGER FRANK·Filed 2008·Granted Feb 16, 2016·0 cites·27 claims
- 1243US2016126189A1Programmable Devices and Methods of Manufacture ThereofINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
- 1340US2009014807A1Dual stress liners for integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →