Inventor · disambiguated record
Francisco Machuca
Also filed as: MACHUCA FRANCISCO · MACHUCA FRANCISCO XAVIER
2 granted patents·7 pending applications·13 citations·filing 2020–2024
50Inventor score
Top patents by PatentIndex Score
9 records- 0187US11448603B1Methods and apparatuses for microscopy and spectroscopy in semiconductor systemsAXIOMATIQUE TECH INC·Filed 2021·Granted Sep 20, 2022·13 cites·20 claims
- 0276US2024419885A1Hybrid modeling for film metrologyTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0366US2025060324A1Hybrid x-ray and optical metrology and navigationTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0460US2024387448A1Roentgen integrated metrology for hybrid bonding process control in ultra high 3d integrationTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0560US2025305971A1X-ray methods and systems for semiconductor substrate alignmentTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0659US2025157801A1Sub-millisecond optical detection of pulsed plasma processesTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0754US2024339309A1Advanced OES CharacterizationTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0847US12306112B2Methods and apparatus for detecting defects in semiconductor systemsAXIOMATIQUE TECH INC·Filed 2021·Granted May 20, 2025·0 cites·18 claims
- 0942US2022120699A1Methods and apparatus for detecting defects in semiconductor systemsAXIOMATIQUE TECH INC·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →