Inventor · disambiguated record
Frederick L. Maltby
Also filed as: KRAMER L JONATHAN · MALTBY FREDERICK · MALTBY FREDERICK L · SUN ROBERT J
26 granted patents·719 citations·filing 1974–1999
97Inventor score
Top patents by PatentIndex Score
26 records- 0191US4146834AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1976·Granted Mar 27, 1979·52 cites·35 claims
- 0288US4235106ASystem and method for obtaining compensated level measurementsDREXELBROOK CONTROLS·Filed 1978·Granted Nov 25, 1980·43 cites·26 claims
- 0385US4757252AProbe system for measuring the condition of materialsDREXELBROOK CONTROLS·Filed 1985·Granted Jul 12, 1988·55 cites·22 claims
- 0481US6062070AMethod and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste waterDREXELBROOK CONTROLS·Filed 1996·Granted May 16, 2000·55 cites·25 claims
- 0581US4723122ARemotely calibratable instrument systemDREXELBROOK CONTROLS·Filed 1985·Granted Feb 2, 1988·35 cites·99 claims
- 0681US4166388ARF Admittance measuring method and apparatus for determining the level of a conductive liquidDREXELBROOK CONTROLS·Filed 1977·Granted Sep 4, 1979·29 cites·8 claims
- 0779US5510779AError compensating instrument system with digital communicationsDREXELBROOK CONTROLS·Filed 1993·Granted Apr 23, 1996·58 cites·22 claims
- 0878US4208909AAdmittance sensing probe having multiple sensing elementsDREXELBROOK CONTROLS·Filed 1978·Granted Jun 24, 1980·26 cites·26 claims
- 0977US4568874ARF Admittance apparatus and method for monitoring the contents of a pipeDREXELBROOK CONTROLS·Filed 1983·Granted Feb 4, 1986·29 cites·11 claims
- 1075US5760309AUltrasonic method for material monitoringDREXELBROOK ENG CO·Filed 1996·Granted Jun 2, 1998·36 cites·80 claims
- 1173US3993947AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1974·Granted Nov 23, 1976·19 cites·28 claims
- 1272US5987994AUltrasonic method for material monitoringDREXELBROOK ENG CO·Filed 1998·Granted Nov 23, 1999·35 cites·42 claims
- 1372US4064753ARF admittance measuring method and apparatus for determining the level of a conductive liquidDREXELBROOK CONTROLS·Filed 1974·Granted Dec 27, 1977·18 cites·40 claims
- 1472US3936738AMethod of and apparatus for measuring the amount of coating material applied to substratesDREXELBROOK CONTROLS·Filed 1974·Granted Feb 3, 1976·17 cites·9 claims
- 1569US5777550AHigh reliability instrument systemDREXELBROOK CONTROLS·Filed 1997·Granted Jul 7, 1998·37 cites·6 claims
- 1667US4332167AMethod of making an RF admittance measuring probe and product thereofDREXELBROOK CONTROLS·Filed 1979·Granted Jun 1, 1982·22 cites·14 claims
- 1765US4301681AMethod of using capacitor probe with a semiconductive electrodeDREXELBROOK CONTROLS·Filed 1979·Granted Nov 24, 1981·17 cites·19 claims
- 1865US4042497ASeptic system with level controlMALTBY FREDERICK L·Filed 1975·Granted Aug 16, 1977·22 cites·19 claims
- 1962US5539670ACoating responsive material condition monitoring systemDREXELBROOK CONTROLS·Filed 1994·Granted Jul 23, 1996·22 cites·18 claims
- 2061US6212943B1Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment on waste waterAMETEK INC·Filed 1999·Granted Apr 10, 2001·23 cites·7 claims
- 2158US4849754ARemotely calibratable instrument systemDREXELBROOK CONTROLS·Filed 1988·Granted Jul 18, 1989·14 cites·28 claims
- 2258US4363030AFail-safe instrument systemDREXELBROOK ENG CO·Filed 1979·Granted Dec 7, 1982·13 cites·30 claims
- 2353US4428026ATwo layer probeDREXELBROOK CONTROLS·Filed 1981·Granted Jan 24, 1984·14 cites·19 claims
- 2450US4511948ATwo layer probeDREXELBROOK CONTROLS·Filed 1984·Granted Apr 16, 1985·12 cites·10 claims
- 2545US4573040AFail-safe instrument systemDREXELBROOK ENG CO·Filed 1985·Granted Feb 25, 1986·13 cites·12 claims
- 2633US5835454ATransducer shroud for improved transducer operation in the treatment of waste waterDREXELBROOK CONTROLS·Filed 1997·Granted Nov 10, 1998·3 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when Frederick L. Maltby files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →