Inventor · disambiguated record
Francis T. Mcquade
Also filed as: MCQUADE FRANCIS T
12 granted patents·2 pending applications·514 citations·filing 1994–2016
92Inventor score
Top patents by PatentIndex Score
14 records- 0195US5416429AProbe assembly for testing integrated circuitsWENTWORTH LAB INC·Filed 1994·Granted May 16, 1995·158 cites·15 claims
- 0290US6160412AImpedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipmentWENTWORTH LAB INC·Filed 1998·Granted Dec 12, 2000·114 cites·10 claims
- 0387US6566898B2Temperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 2001·Granted May 20, 2003·50 cites·17 claims
- 0487US6297657B1Temperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 1999·Granted Oct 2, 2001·88 cites·6 claims
- 0582US6661244B2Nickel alloy probe card frame laminateWENTWORTH LAB INC·Filed 2002·Granted Dec 9, 2003·35 cites·15 claims
- 0679US6906540B2Method for chemically etching photo-defined micro electrical contactsWENTWORTH LAB INC·Filed 2001·Granted Jun 14, 2005·31 cites·13 claims
- 0769US6633175B1Temperature compensated vertical pin probing deviceWENWORTH LAB INC·Filed 2000·Granted Oct 14, 2003·20 cites·7 claims
- 0864US7282934B2Flexible microcircuit space transformer assemblyWENTWORTH LAB INC·Filed 2005·Granted Oct 16, 2007·5 cites·14 claims
- 0960US10281491B2Probe card for testing semiconductor wafersMCQUADE FRANCIS T·Filed 2016·Granted May 7, 2019·1 cites·12 claims
- 1058US6977515B2Method for forming photo-defined micro electrical contactsWENTWORTH LAB INC·Filed 2003·Granted Dec 20, 2005·10 cites·7 claims
- 1152US8264248B2Micro probe assemblyMCQUADE FRANCIS T·Filed 2007·Granted Sep 11, 2012·2 cites·5 claims
- 1244US8717056B2Probing assembly for testing integrated circuitsMCQUADE FRANCIS T·Filed 2012·Granted May 6, 2014·0 cites·10 claims
- 1342US2015369842A1Probe card for testing semiconductor wafersMCQUADE FRANCIS T·Filed 2014·Application pending·0 cites
- 1438US2008238452A1Vertical micro probesDSL LABS INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →