Inventor · disambiguated record
Frank O. Uher
Also filed as: UHER FRANK O · UHER FRANK OTTO
23 granted patents·711 citations·filing 1992–2023
97Inventor score
Top patents by PatentIndex Score
23 records- 0198US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0298US6340895B1Wafer-level burn-in and test cartridgeAEHR TEST SYSTEMS INC·Filed 1999·Granted Jan 22, 2002·211 cites·44 claims
- 0397US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 0497US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 0596US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 0696US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 0794US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 0894US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 0993US6580283B1Wafer level burn-in and test methodsAEHR TEST SYSTEMS·Filed 1999·Granted Jun 17, 2003·109 cites·35 claims
- 1091US6853209B1Contactor assembly for testing electrical circuitsAEHR TEST SYSTEMS·Filed 2002·Granted Feb 8, 2005·42 cites·14 claims
- 1189US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 1284US7088117B2Wafer burn-in and test employing detachable cartridgeAEHR TEST SYSTEM·Filed 2003·Granted Aug 8, 2006·26 cites·26 claims
- 1383US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 1482US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 1582US5447570APurge gas in wafer coating area selectionGENUS INC·Filed 1992·Granted Sep 5, 1995·88 cites·33 claims
- 1681US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 1772US6556032B2Wafer-burn-in and test employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2001·Granted Apr 29, 2003·11 cites·25 claims
- 1872US6413113B2Kinematic couplingAEHR TEST SYSTEMS·Filed 1999·Granted Jul 2, 2002·33 cites·29 claims
- 1969US10852347B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2018·Granted Dec 1, 2020·0 cites·14 claims
- 2067US7541822B2Wafer burn-in and text employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2006·Granted Jun 2, 2009·3 cites·15 claims
- 2164US10094872B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2016·Granted Oct 9, 2018·0 cites·16 claims
- 2262US5387289AFilm uniformity by selective pressure gradient controlGENUS INC·Filed 1992·Granted Feb 7, 1995·36 cites·9 claims
- 2358US7301358B2Contactor assembly for testing electrical circuitsAEHR TEST SYSTEMS·Filed 2004·Granted Nov 27, 2007·6 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Frank O. Uher files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →