Inventor · disambiguated record
Frantisek Vaske
Also filed as: VASKE FRANTISEK · VAŠKE FRANTIŠEK
1 granted patent·2 pending applications·2 citations·filing 2018–2023
18Inventor score
Files withFEI CO3
Top patents by PatentIndex Score
3 records- 0170US10629409B2Specimen preparation and inspection in a dual-beam charged particle microscopeFEI CO·Filed 2018·Granted Apr 21, 2020·2 cites·20 claims
- 0247US2022319801A1Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscopeFEI CO·Filed 2022·Application pending·0 cites
- 0345US2024162001A1Method of sample preparaton and analysisFEI CO·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →